Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Display Documents


Institute:
Collection:
Print in Citation style Print version     Display:
Sort by: Display records with Fulltext only
Entries: 1-3  
 Basket 
Experimental Investigations of Ion Charge Distributions, Effective Electron Densities, and Electron-Ion Cloud Overlap in Electron Beam Ion Trap Plasma Using Extreme-Ultraviolet Spectroscopy
Authors: Liang, G. Y.; Crespo López-Urrutia, J. R.; Baumann, T. M.; Epp, S. W.; Gonchar, A.; Lapierre, A.; Mokler, P. H.; Simon, M. C.; Tawara, H.; Mäckel, V.; Yao, K.; Zhao, G.; Zou, Y.; Ullrich, J.
Date of Publication (YYYY-MM-DD): 2009-08-17
Title of Journal: Astrophysical Journal
Volume: 702
Issue / Number: 2
Start Page: 838
End Page: 850
Document Type: Article
ID: 441475.0
Extreme-Ultraviolet Spectroscopy of Fe VI-Fe XV and its Diagnostic Application for Electron Beam Ion Trap Plasmas
Authors: Liang, G. Y.; Baumann, T. M.; Crespo López-Urrutia, J. R.; Epp, S. W.; Tawara, H.; Gonchar, A.; Mokler, P. H.; Zhao, G.; Ullrich, J.
Date of Publication (YYYY-MM-DD): 2009-04-29
Title of Journal: Astrophysical Journal
Volume: 696
Issue / Number: 2
Start Page: 2275
End Page: 2289
Document Type: Article
ID: 441470.0
Compact soft x-ray spectrometer for plasma diagnostics at the Heidelberg Electron Beam Ion Trap
Authors: Lapierre, A.; Crespo López-Urrutia, J. R.; Baumann, T. M.; Epp, S. W.; Gonchar, A.; Martinez, A. J. G.; Liang, G.; Rohr, A.; Soria Orts, R.; Simon, M. C.; Tawara, H.; Versteegen, R.; Ullrich, J.
Date of Publication (YYYY-MM-DD): 2007-12
Title of Journal: Review of Scientific Instruments
Volume: 78
Issue / Number: 12
Sequence Number of Article: 123105
Document Type: Article
ID: 336309.0
Entries: 1-3  
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.