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Electron angular distributions in He single ionization impact by H2+ ions at 1 MeV
Authors: Zhang, S.; Suske, J.; Fischer, D.; Kühnel, U.; Hagmann, S.; Voitkiv, A.; Najjari, B.; Krauss, A.; Moshammer, R.; Ullrich, J.; Xinwen, M.
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: 14TH INTERNATIONAL CONFERENCE ON THE PHYSICS OF HIGHLY CHARGED IONS (HCI 2008)
Title of Journal: Journal of Physics - Conference Series
Volume (in Journal): 163
Issue / Number: 1
Sequence Number: 012041
Document Type: Conference-Paper
ID: 464518.0
Low energy helium implantation in evaporated nickel surfaces
Authors: Nygren, R. E.; Doyle, B. L.; Walsh, D. S.; Ottenberger, W.; Brooks, J. N.; Krauss, A.
Date of Publication (YYYY-MM-DD): 1992
Title of Journal: Journal of Nuclear Materials
Volume: 196
Start Page: 558
End Page: 563
Document Type: Article
ID: 657903.0
Entries: 1-2  
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