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Analysis of background events in Silicon Drift Detectors
Authors: Eggert, T.; Goldstrass, P.; Kemmer, J.; Pahlke, A.
Date of Publication (YYYY-MM-DD): 2003
Name of Conference/Meeting: Proceedings of the 9th European Symposium on Semiconductor Detect ors: New Developments on Radiation Detectors
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A
Volume (in Journal): 512
Issue / Number: 1-2
Start Page: 257
End Page: 264
Document Type: Conference-Paper
ID: 63173.0
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