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Electron spin resonance analysis of Si nanocrystals embedded in a SiO< sub>2 < /sub > matrix.
Authors: Jivanescu, M.; Stesmans, A.; Godefroo, S.; Zacharias, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Journal of Optoelectronics and Advanced Materials
Volume: 9
Start Page: 721
End Page: 724
Document Type: Article
ID: 350495.0
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