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Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers
Authors: Łaszcz, A.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Phillipp, F.; van Aken, P. A.; Katcki, J.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 347
End Page: 351
Document Type: Conference-Paper
ID: 458891.0
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