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Low-loss electron spectroscopy using monochromated electrons
Authors: Sigle, W.; Srot, V.; Gu, L.; Koch, C. T.; Höschen, R.; Essers, E.; Matijevic, M.; Benner, G.; Thesen, A.; Rühle, M.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 811
End Page: 811
Document Type: Conference-Paper
ID: 287719.0
Low-loss electron spectroscopy using monochromated electrons
Authors: Sigle, W.; Srot, V.; Gu, L.; Koch, C. T.; Höschen, R.; Essers, E.; Matijevic, M.; Benner, G.; Thesen, A.; Rühle, M.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 811
End Page: 811
Document Type: Conference-Paper
ID: 319827.0
Entries: 1-2  
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