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Entries: 1-10  
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Backscattering effect in quantitative AES sputter depth profiling of multilayers
Authors: Hofmann, S.; Wang, J. Y.; Zalar, A.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Surface and Interface Analysis
Volume: 39
Start Page: 787
End Page: 797
Document Type: Article
ID: 334490.0
 
Full text / Content available
Backscattering effect in quantitative AES sputter depth profiling of multilayers
Authors: Hofmann, S.; Wang, J. Y.; Zalar, A.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Surface and Interface Analysis
Volume: 39
Start Page: 787
End Page: 797
Document Type: Article
ID: 335118.0
Interdiffusion in microstructurally different Si/Al multilayered structures.
Authors: Wang, J. Y.; He, D.; Zalar, A.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Surface and Interface Analysis
Volume: 38
Start Page: 773
End Page: 776
Document Type: Article
ID: 285327.0
 
Full text / Content available
AES depth profiling and interface analysis of C/Ta bilayers
Authors: Zalar, A.; Kovac, J.; Pracek, B.; Hofmann, S.; Panjan, P.
Date of Publication (YYYY-MM-DD): 2005-12-15
Title of Journal: Applied Surface Science
Volume: 252
Issue / Number: 5
Start Page: 2056
End Page: 2062
Document Type: Article
ID: 367988.0
Depth Dependences of the Ion Bombardment Induced Roughness and of the Interdiffusion Coefficient for Si/Al Multilayers.
Authors: Wang, J. Y.; Zalar, A.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2004
Title of Journal: Applied Surface Science
Volume: 222
Start Page: 171
End Page: 179
Document Type: Article
ID: 124092.0
 
Full text / Content available
AES depth profiling of thermally treated Al/Si thin-film structures
Authors: Zalar, A.; Wang, J.Y.; Zhao, Y.H.; Mittemeijer, E.J.; Panjan, P.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Vacuum
Volume: 71
Start Page: 11
End Page: 17
Document Type: Article
ID: 47144.0
 
Full text / Content available
Determination of the interdiffusion coefficient for Si/Al multilayers by auger electron spectroscopical sputter depth profiling
Authors: Wang, J. Y.; Zalar, A.; Zhao, Y. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Thin Solid Films
Volume: 433
Start Page: 92
End Page: 96
Document Type: Article
ID: 47155.0
 
Full text / Content available
Quantitative evaluation of sputtering induced surface roughness in depth profiling of polycrystalline multilayers using auger electron spectroscopy
Authors: Wang, J. Y.; Hofmann, S.; Zalar, A.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Thin Solid Films
Volume: 444
Start Page: 120
End Page: 124
Document Type: Article
ID: 114061.0
 
Full text / Content available
Interdiffusion at TiO2/Ti, TiO2/Ti3Al and TiO2/TiAl interfaces studied in bilayer structures
Authors: Zalar, A.; van Lier, J.; Mittemeijer, E. J.; Kovac, J.
Date of Publication (YYYY-MM-DD): 2002-08
Title of Journal: Surface and Interface Analysis
Volume: 34
Issue / Number: 1
Start Page: 514
End Page: 518
Document Type: Article
ID: 6710.0
Reactions in TiO2/Ti3Al and TiO2/TiAl bilayers: Application of target-factor analysis in auger electron spectroscopy
Authors: van Lier, J.; Baretzky, B.; Zalar, A.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Surface and Interface Analysis
Volume: 30
Start Page: 124
End Page: 129
Document Type: Article
ID: 200640.0
Entries: 1-10  
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