Home News About Us Contact Contributors Disclaimer Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Display Documents


Institute:
Collection:
Print in Citation style Print version     Display:
Sort by: Display records with Fulltext only
Entries: 1-2  
 Basket 
Numerical analysis of x-ray reflectivity data from organic thin films at interfaces
Authors: Asmussen, A.; Riegler, H.
Date of Publication (YYYY-MM-DD): 1996
Title of Journal: Journal of Chemical Physics
Volume: 104
Issue / Number: 20
Start Page: 8159
End Page: 8164
Document Type: Article
ID: 377347.0
 
Full text / Content available
X-ray reflectivity study of behenic acid Langmuir-Blodgett mono- and multilayers on SiO₂ surfaces as-deposited and after thermal treatment: Influence of substrate/film interactions on molecular ordering and film topology
Authors: Asmussen, A.; Riegler, H.
Date of Publication (YYYY-MM-DD): 1996
Title of Journal: Journal of Chemical Physics
Volume: 104
Issue / Number: 20
Start Page: 8151
End Page: 8158
Document Type: Article
ID: 377825.0
 
Full text / Content available
Entries: 1-2  
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.