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Deformable shape matching
Authors: Tevs, Art
Name of University: Universität des Saarlandes
Place of University: Saarbrücken
Date of Approval (YYYY-MM-DD): 2011-12-21
Document Type: PhD-Thesis
ID: 618909.0
Intrinsic Shape Matching by Planned Landmark Sampling
Authors: Tevs, Art; Berner, Alexander; Wand, Michael; Ihrke, Ivo; Seidel, Hans-Peter
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Computer Graphics Forum (Proceedings Eurographics 2011)
Volume: 30
Issue / Number: 2
Start Page: 543
End Page: 552
Document Type: Article
ID: 618855.0
Wavelet Belief Propagation for Large Scale Inference Problems
Authors: Lasowski, Ruxandra; Tevs, Art; Wand, Michael; Seidel, Hans-Peter
Place of Publication: Piscataway, NJ
Publisher: IEEE
Date of Publication (YYYY-MM-DD): 2011
Title of Proceedings: 2011 IEEE Conference on Computer Vision and Pattern Recognition (CVPR)
Start Page: 1921
End Page: 1928
Document Type: Conference-Paper
ID: 618865.0
A Bayesian Approach to Manifold Topology Reconstruction
Authors: Tevs, Art; Wand, Michael; Ihrke, Ivo; Seidel, Hans-Peter
Place of Publication: Saarbrücken
Publisher: Max-Planck-Institut für Informatik
Date of Publication (YYYY-MM-DD): 2010
Title of (Report) Series: Research Report / Max-Planck-Institut für Informatik
Document Type: Report
ID: 537282.0
 
Full text / Content available
Real-time Generation of Digital Bas-Reliefs
Authors: Kerber, Jens; Tevs, Art; Zayer, Rhaleb; Belyaev, Alexander; Seidel, Hans-Peter
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Computer-Aided Design and Applications (Special Issue: CAD in the Arts)
Volume: 7
Issue / Number: 4
Start Page: 465
End Page: 478
Document Type: Article
ID: 537313.0
 
Full text / Content available
A Probabilistic Framework for Partial Intrinsic Symmetries in Geometric Data
Authors: Lasowski, Ruxandra; Tevs, Art; Seidel, Hans-Peter; Wand, Michael
Place of Publication: Washington, DC, USA
Publisher: IEEE Computer Society
Date of Publication (YYYY-MM-DD): 2009
Title of Proceedings: 12th International Conference on Computer Vision (ICCV)
Start Page: 963
End Page: 970
Document Type: Conference-Paper
ID: 520478.0
Feature Sensitive Bas Relief Generation
Authors: Kerber, Jens; Tevs, Art; Zayer, Rhaleb; Belyaev, Alexander; Seidel, Hans-Peter
Place of Publication: Washington, USA
Publisher: IEEE Computer Society Press
Date of Publication (YYYY-MM-DD): 2009
Title of Proceedings: IEEE International Conference on Shape Modeling and Applications Proceedings
Start Page: 148
End Page: 154
Document Type: Conference-Paper
ID: 520477.0
Isometric Registration of Ambiguous and Partial Data
Authors: Tevs, Art; Bokeloh, Martin; Wand, Michael; Schilling, Andres; Seidel, Hans-Peter
Place of Publication: Washington, DC, USA
Publisher: IEEE Computer Society
Date of Publication (YYYY-MM-DD): 2009
Title of Proceedings: IEEE Computer Society Conference on Computer Vision and Pattern Recognition (CVPR 2009)
Document Type: Conference-Paper
ID: 520491.0
Maximum Mipmaps for Fast, Accurate, and Scalable Dynamic Height Field Rendering
Authors: Tevs, Art; Ihrke, Ivo; Seidel, Hans-Peter
Place of Publication: New York, NY
Publisher: ACM
Date of Publication (YYYY-MM-DD): 2008
Title of Proceedings: Proceedings I3D 2008 : Symposium on Interactive 3D Graphics and Games
Start Page: 183
End Page: 190
Document Type: Conference-Paper
ID: 428234.0
Time-resolved 3D Capture of Non-stationary Gas Flows
Authors: Atcheson, Bradley; Ihrke, Ivo; Heidrich, Wolfgang; Tevs, Art; Bradley, Derek; Magnor, Marcus; Seidel, Hans-Peter
Place of Publication: New York, NY
Publisher: ACM
Date of Publication (YYYY-MM-DD): 2008
Title of Proceedings: ACM SIGGRAPH Asia 2008 papers
Start Page: Art.132.1
End Page: 9
Title of Series: ACM Transactions on Graphics,
Document Type: Conference-Paper
ID: 427981.0
Entries: 1-10  
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