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Entries: 1-9  
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In-situ TEM straining experiments of Al films on polyimide using a novel FIB design for specimen preparation
Authors: Dehm, G.; Legros, M.; Heiland, B.
Date of Publication (YYYY-MM-DD): 2006-07
Title of Journal: Journal of Materials Science
Volume: 41
Issue / Number: 14
Start Page: 4484
End Page: 4489
Document Type: Article
ID: 297819.0
Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling
Authors: Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.
Date of Publication (YYYY-MM-DD): 2004-06
Title of Journal: Journal of Microscopy
Volume: 214
Start Page: 208
End Page: 212
Document Type: Article
ID: 220192.0
Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling
Authors: Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.
Date of Publication (YYYY-MM-DD): 2004
Title of Journal: Journal of Microscopy
Volume: 214
Start Page: 208
End Page: 212
Document Type: Article
ID: 175368.0
Preparation of hard-to-make TEM samples using the FIB microscope
Authors: Volkert, C. A.; Heiland, B.; Kauffmann, F.
Date of Publication (YYYY-MM-DD): 2003-04
Title of Journal: Praktische Metallographie-Practical Metallography
Volume: 40
Issue / Number: 4
Start Page: 193
End Page: 208
Document Type: Article
ID: 112769.0
Focussed ion beam methods applied to biological materials: sample preparation and investigation
Authors: Wegst, U. G. K.; Heiland, B.; Arzt, E.
Place of Publication: Onderstepoort
Publisher: Microscopy Society of Southern Africa
Date of Publication (YYYY-MM-DD): 2002
Name of Conference/Meeting: ICEM 15. 15th International Congress on Electron Microscopy
Title of Proceedings: Proceedings of the 15th International Congress on Electron Microscopy (ICEM 15). Vol. 1. Physics and Materials
Start Page: 607
End Page: 608
Document Type: Conference-Paper
ID: 126162.0
 
Full text / Content available
The preparation of TEM-specimens using Focused Ion Beam (FIB)
Authors: Spolenak, R.; Heiland, B.; Witt, C.; Keller, R. M.; Müllner, P.; Arzt, E.
Date of Publication (YYYY-MM-DD): 2000-02
Title of Journal: Praktische Metallographie - Practical Metallography
Volume: 37
Issue / Number: 2
Start Page: 90
End Page: 101
Document Type: Article
ID: 204331.0
Microstructure of thermal hillocks on blanket Al thin films
Authors: Kim, D.; Heiland, B.; Nix, W. D.; Arzt, E.; Deal, M. D.; Plummer, J. D.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Thin Solid Films
Volume: 371
Start Page: 278
End Page: 282
Document Type: Article
ID: 198853.0
Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions
Authors: Wei, B.-Q.; Kohler-Redlich, P.; Bäder, U.; Heiland, B.; Spolenak, R.; Arzt, E.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Ultramicroscopy
Volume: 85
Start Page: 93
End Page: 98
Document Type: Article
ID: 198921.0
Selective specimen preparation for TEM observation of the cross-section of individual carbon nanotube/metal junctions
Authors: Wei, B.-Q.; Kohler-Redlich, P.; Bäder, U.; Heiland, B.; Spolenak, R.; Arzt, E.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Ultramicroscopy
Volume: 85
Start Page: 93
End Page: 98
Document Type: Article
ID: 198922.0
Entries: 1-9  
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