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Entries: 1-10  
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Attenuated Total Reflection Mid-IR-spectroscopy for Electrochemical Applications using a QCL
Authors: Pengel, S.; Schönberger, B.; Nayak, S.; Erbe, A.
Publisher: Optical Society of America, 2012
Name of Conference/Meeting: Laser Applications to Chemical, Security and Environmental Analysis (LACSEA)
Title of Proceedings: Lasers, Sources, and Related Photonic Devices Technical Digest
Volume (in Series): Lt6b.1.
Document Type: Conference-Paper
ID: 609158.0
A scanning kelvin probe for synchrotron investigations; the in situ detection of radiation-induced potential changes
Authors: Salgin, B.; Vogel, D.; Pontoni, D.; Schröder, H.; Schönberger, B.; Stratmann, M.; Reichert, H.; Rohwerder, M.
Date of Publication (YYYY-MM-DD): 2012-01
Title of Journal: Journal of Synchrotron Radiation
Volume: 19
Start Page: 48
End Page: 53
Document Type: Article
ID: 609564.0
A scanning Kelvin probe for synchrotron investigations: The in situ detection of radiation-induced potential changes
Authors: Salgin, B.; Vogel, D.; Pontoni, D.; Schröder, H.; Schönberger, B.; Stratmann, M.; Reichert, H.; Rohwerder, M.
Date of Publication (YYYY-MM-DD): 2012
Title of Journal: Journal of Synchrotron Radiation
Volume: 19
Issue / Number: 1
Start Page: 48
End Page: 53
Document Type: Article
ID: 582329.0
Integrated Scanning Kelvin Probe-Scanning Electrochemical Microscope System: Development and First Applications
Authors: Maljusch, A.; Schönberger, B.; Lindner, A.; Stratmann, M.; Rohwerder, M.; Schuhmann, W.
Date of Publication (YYYY-MM-DD): 2011-08-01
Title of Journal: Analytical Chemistry
Volume: 83
Issue / Number: 15
Start Page: 6114
End Page: 6120
Document Type: Article
ID: 569722.0
An in-situ tensile tester for studying electrochemical repassivation behavior – fabrication and challenges
Authors: Neelakantan, L.; Schönberger, B.; Eggeler, G.; Hassel, A. W.
Date of Publication (YYYY-MM-DD): 2010-03
Title of Journal: Revue of Scientific Instruments
Volume: 81
Issue / Number: 3
Start Page: 033902-1
End Page: 033902-5
Document Type: Article
ID: 532895.0
Height-regulating scanning Kelvin probe for simultaneous measurement of surface topology and electrode potentials at buried polymer/metal interfaces
Authors: Wapner, K.; Schoenberger, B.; Stratmann, M.; Grundmeier, G.
Date of Publication (YYYY-MM-DD): 2005
Title of Journal: Journal of the Electrochemical Society
Volume: 152
Issue / Number: 3
Start Page: E114
End Page: E122
Document Type: Article
ID: 224488.0
Applications of a new height regulated Scanning Kelvin Probe in Adhesion and Corrosion Science
Authors: Wapner, K.; Schönberger, B.; Stratmann, M.; Grundmeier, G.
Date of Publication (YYYY-MM-DD): 2005
Title of Journal: Journal of the Electrochemical Society
Volume: 152
Issue / Number: 3
Start Page: E114
End Page: E122
Document Type: Article
ID: 244916.0
Fundamentals and Applications of a new height regulated Scanning Kelvin Probe in Corrosion and Adhesion Science
Authors: Grundmeier, G.; Wapner, K.; Schönberger, B.; Stratmann, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2004-09-19
Name of Conference/Meeting: ISE 2004
Place of Conference/Meeting: Thessaloniki, Greece
Document Type: Talk at Event
ID: 206584.0
Introduction of a height regulated Scanning Kelvin Probe for the simultaneous measurement of surface topography and interfacial electrode potentials in corrosive environments
Authors: Grundmeier, G.; Wapner, K.; Schönberger, B.; Stratmann, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2004-09-19
Name of Conference/Meeting: ISE Conference, 55th Annual Meeting
Place of Conference/Meeting: Thessaloniki, Greece
Document Type: Talk at Event
ID: 288666.0
Non-destructive, real time in-situ measurement of de-adhesion processes at buried adhesive/metal interfaces by means of a new Scanning Kelvin Probe Blister Test
Authors: Grundmeier, G.; Wapner, K.; Schönberger, B.; Stratmann, M.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2004-02-15
Name of Conference/Meeting: Annual Meeting of the American Adhesion Society
Place of Conference/Meeting: Wilmington, UK
Document Type: Talk at Event
ID: 206575.0
Entries: 1-10  
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