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Entries: 1-4  
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Materials for polymer electronics applications semiconducting polymer thin films and nanoparticles
Authors: Asawapirom, U.; Bulut, F.; Farrell, T.; Gadermaier, C.; Gamerith, S.; Guntner, R.; Kietzke, T.; Patil, S.; Piok, T.; Montenegro, R.; Stiller, B.; Tiersch, B.; Landfester, K.; List, E. J. W.; Neher, D.; Torres, C. S.; Scherf, U.
Date of Publication (YYYY-MM-DD): 2004-04
Title of Journal: Macromolecular Symposia
Volume: 212
Start Page: 83
End Page: 91
Document Type: Article
ID: 214597.0
Ellipsometric and atomic force microscopic investigations on poly(para-phenylenevinylene) and poly(phenylquinoxaline) thin films.
Authors: Flueraru, C.; Schrader, S.; Zauls, V.; Motschmann, H.; Stiller, B.; Kiebooms, R.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Synthetic Metals
Volume: 111
Start Page: 603
End Page: 606
Document Type: Article
ID: 289893.0
 
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Sensitivity analysis of ellipsometry applied to uniaxial optical films.
Authors: Flueraru, C.; Schrader, S.; Zauls, V.; Motschmann, H.; Stiller, B.; Kiebooms, R.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Thin Solid Films
Volume: 379
Start Page: 15
End Page: 22
Document Type: Article
ID: 289894.0
 
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Wettability, surface morphology, and stability of long-chain ester multilayers obtained by different Langmuir-Blodgett deposition types
Authors: Angelova, A.; Penacorada, F.; Stiller, B.; Zetzsche, T.; Ionov, R.; Kamusewitz, H.; Brehmer, L.
Date of Publication (YYYY-MM-DD): 1994
Title of Journal: Journal of Physical Chemistry
Volume: 98
Start Page: 6790
End Page: 6796
Document Type: Article
ID: 367826.0
 
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Entries: 1-4  
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