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Ultrafast Bond Softening in Bismuth: Mapping a Solid's Interatomic Potential with X-rays
Authors: Fritz, D. M.; Reis, D. A.; Adams, B.; Akre, R. A.; Arthur, J.; Blome, C.; Bucksbaum, P. H.; Cavalieri, Adrian L.; Engemann, S.; Fahy, S.; Falcone, R. W.; Fuoss, P. H.; Gaffney, K. J.; George, M. J.; Hajdu, J.; Hertlein, M. P.; Hillyard, P. B.; Horn-von Hoegen, M.; Kammler, M.; Kaspar, J.; Kienberger, Reinhard; Krejcik, P.; Lee, S. H.; Lindenberg, A. M.; McFarland, B.; Meyer, D.; Montagne, T.; Murray, E. D.; Nelson, A. J.; Nicoul, M.; Pahl, R.; Rudati, J.; Schlarb, H.; Siddons, D. P.; Sokolowski-Tinten, K.; Tschentscher, Th.; von der Linde, D.; Hastings, J. B.
Date of Publication (YYYY-MM-DD): 2007-02-02
Title of Journal: Science
Volume: 315
Issue / Number: 5812
Start Page: 633
End Page: 636
Document Type: Article
ID: 301369.0
 
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Temperature-dependent interfacial stiffness of the disorder layer in a thin Cu3Au alloy film
Authors: Ern, C.; Donner, W.; Dosch, H.; Adams, B.; Nowikow, D.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Physical Review Letters
Volume: 85
Start Page: 1926
End Page: 1929
Document Type: Article
ID: 43788.0
Entries: 1-2  
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