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Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging
Authors: Titze, Benjamin
Name of University: Ruprecht−Karls−Universität Heidelberg
Place of University: Heidelberg
Date of Approval (YYYY-MM-DD): 2013-07-24
Document Type: PhD-Thesis
ID: 681449.0
Automated in−chamber specimen coating for serial block−face electron microscopy
Authors: Titze, Benjamin; Denk, Winfried
Date of Publication (YYYY-MM-DD): 2013-05-01
Title of Journal: Journal of Microscopy
Volume: 250
Issue / Number: 2
Start Page: 101
End Page: 110
Document Type: Article
ID: 681466.0
A long−life low−noise microwave−driven ion gun for SEM charge neutralization
Authors: Titze, Benjamin
Type of Thesis (e.g.Diploma): diplom
Date of Approval (YYYY-MM-DD): 2008-01-01
Name of University: Ruprecht−Karls−Universität Heidelberg
Place of University: Heidelberg
Document Type: Thesis
ID: 567339.0
Entries: 1-3  
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