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Length-scale-controlled fatigue mechanisms in thin copper films
Authors: Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Wellner, P.; Arzt, E.
Date of Publication (YYYY-MM-DD): 2006-05-16
Title of Journal: Acta Materialia
Volume: 54
Start Page: 3127
End Page: 3139
Document Type: Article
ID: 284885.0
Frequency effect on thermal fatigue damage in CU interconnects
Authors: Park, Y.-B.; Mönig, R.; Volkert, C. A.
Date of Publication (YYYY-MM-DD): 2006-02-24
Title of Journal: Thin Solid Films
Volume: 515
Issue / Number: 6
Start Page: 3253
End Page: 3258
Document Type: Article
ID: 319077.0
Microscopic investigation of strain localization and fatigue damage in thin Cu films
Authors: Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Kraft, O.
Date of Publication (YYYY-MM-DD): 2005-09-14
Title of Journal: Materials Science Forum
Volume: 475-479
Start Page: 3647
End Page: 3650
Document Type: Article
ID: 240396.0
Local strains measured in Al lines during thermal cycling and electromigration using convergent-beam electron diffraction
Authors: Nucci, J.; Krämer, S.; Arzt, E.; Volkert, C. A.
Date of Publication (YYYY-MM-DD): 2005-07
Title of Journal: Journal of Materials Research
Volume: 20
Issue / Number: 7
Start Page: 1851
End Page: 1859
Document Type: Article
ID: 240311.0
Damage behavior of 200-nm thin copper films under cyclic loading
Authors: Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Arzt, E.; Kraft, O.
Date of Publication (YYYY-MM-DD): 2005-01
Title of Journal: Journal of Materials Research
Volume: 20
Issue / Number: 1
Start Page: 201
End Page: 207
Document Type: Article
ID: 240397.0
Thermal fatigue testing of thin metal films
Authors: Mönig, R.; Keller, R. R.; Volkert, C. A.
Date of Publication (YYYY-MM-DD): 2004-11
Title of Journal: Review of Scientific Instruments
Volume: 75
Issue / Number: 11
Start Page: 4997
End Page: 5004
Document Type: Article
ID: 211874.0
Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling
Authors: Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.
Date of Publication (YYYY-MM-DD): 2004-06
Title of Journal: Journal of Microscopy
Volume: 214
Start Page: 208
End Page: 212
Document Type: Article
ID: 220192.0
Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling
Authors: Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G.
Date of Publication (YYYY-MM-DD): 2004
Title of Journal: Journal of Microscopy
Volume: 214
Start Page: 208
End Page: 212
Document Type: Article
ID: 175368.0
Analysis of local strain in aluminum interconnects by convergent beam electron diffraction
Authors: Krämer, S.; Volkert, C. A.; Mayer, J.
Date of Publication (YYYY-MM-DD): 2003-10
Title of Journal: Microscopy and Microanalysis
Volume: 9
Issue / Number: 5
Start Page: 390
End Page: 398
Document Type: Article
ID: 112089.0
Preparation of hard-to-make TEM samples using the FIB microscope
Authors: Volkert, C. A.; Heiland, B.; Kauffmann, F.
Date of Publication (YYYY-MM-DD): 2003-04
Title of Journal: Praktische Metallographie-Practical Metallography
Volume: 40
Issue / Number: 4
Start Page: 193
End Page: 208
Document Type: Article
ID: 112769.0
Entries: 1-10  
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