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Length-scale-controlled fatigue mechanisms in thin copper films |
Authors: Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Wellner, P.; Arzt, E. | Date of Publication (YYYY-MM-DD): 2006-05-16 | Title of Journal: Acta Materialia | Volume: 54 | Start Page: 3127 | End Page: 3139 | Document Type: Article | ID: 284885.0 |
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Frequency effect on thermal fatigue damage in CU interconnects |
Authors: Park, Y.-B.; Mönig, R.; Volkert, C. A. | Date of Publication (YYYY-MM-DD): 2006-02-24 | Title of Journal: Thin Solid Films | Volume: 515 | Issue / Number: 6 | Start Page: 3253 | End Page: 3258 | Document Type: Article | ID: 319077.0 |
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Microscopic investigation of strain localization and fatigue damage in thin Cu films |
Authors: Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Kraft, O. | Date of Publication (YYYY-MM-DD): 2005-09-14 | Title of Journal: Materials Science Forum | Volume: 475-479 | Start Page: 3647 | End Page: 3650 | Document Type: Article | ID: 240396.0 |
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Local strains measured in Al lines during thermal cycling and electromigration using convergent-beam electron diffraction |
Authors: Nucci, J.; Krämer, S.; Arzt, E.; Volkert, C. A. | Date of Publication (YYYY-MM-DD): 2005-07 | Title of Journal: Journal of Materials Research | Volume: 20 | Issue / Number: 7 | Start Page: 1851 | End Page: 1859 | Document Type: Article | ID: 240311.0 |
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Damage behavior of 200-nm thin copper films under cyclic loading |
Authors: Zhang, G. P.; Volkert, C. A.; Schwaiger, R.; Arzt, E.; Kraft, O. | Date of Publication (YYYY-MM-DD): 2005-01 | Title of Journal: Journal of Materials Research | Volume: 20 | Issue / Number: 1 | Start Page: 201 | End Page: 207 | Document Type: Article | ID: 240397.0 |
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Thermal fatigue testing of thin metal films |
Authors: Mönig, R.; Keller, R. R.; Volkert, C. A. | Date of Publication (YYYY-MM-DD): 2004-11 | Title of Journal: Review of Scientific Instruments | Volume: 75 | Issue / Number: 11 | Start Page: 4997 | End Page: 5004 | Document Type: Article | ID: 211874.0 |
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Transmission electron microscopy of fluorapatite-gelatine composite particles prepared using focused ion beam milling |
Authors: Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G. | Date of Publication (YYYY-MM-DD): 2004-06 | Title of Journal: Journal of Microscopy | Volume: 214 | Start Page: 208 | End Page: 212 | Document Type: Article | ID: 220192.0 |
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Transmission electron microscopy of fluorapatite-gelatine composite particles using focused ion beam milling |
Authors: Volkert, C. A.; Busch, S.; Heiland, B.; Dehm, G. | Date of Publication (YYYY-MM-DD): 2004 | Title of Journal: Journal of Microscopy | Volume: 214 | Start Page: 208 | End Page: 212 | Document Type: Article | ID: 175368.0 |
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Analysis of local strain in aluminum interconnects by convergent beam electron diffraction |
Authors: Krämer, S.; Volkert, C. A.; Mayer, J. | Date of Publication (YYYY-MM-DD): 2003-10 | Title of Journal: Microscopy and Microanalysis | Volume: 9 | Issue / Number: 5 | Start Page: 390 | End Page: 398 | Document Type: Article | ID: 112089.0 |
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Preparation of hard-to-make TEM samples using the FIB microscope |
Authors: Volkert, C. A.; Heiland, B.; Kauffmann, F. | Date of Publication (YYYY-MM-DD): 2003-04 | Title of Journal: Praktische Metallographie-Practical Metallography | Volume: 40 | Issue / Number: 4 | Start Page: 193 | End Page: 208 | Document Type: Article | ID: 112769.0 |
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