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Wachstum, Struktur und Ordnungsverhalten dünner CuAu-Legierungsfilme; eine röntgenographische Untersuchung
Authors: Ern, C.
Name of University: Universität Stuttgart
Place of University: Stuttgart
Date of Approval (YYYY-MM-DD): 2001-04-10
Document Type: PhD-Thesis
ID: 27650.0
Temperature-dependent interfacial stiffness of the disorder layer in a thin Cu3Au alloy film
Authors: Ern, C.; Donner, W.; Dosch, H.; Adams, B.; Nowikow, D.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Physical Review Letters
Volume: 85
Start Page: 1926
End Page: 1929
Document Type: Article
ID: 43788.0
Rigorous mathematical models for the reconstruction of thin films profiles from X-ray intensities
Authors: Slavyanov, S.; Ern, C.; Dosch, H.
Place of Publication: St. Petersburg/Russia
Publisher: SPbU
Date of Publication (YYYY-MM-DD): 2000
Title of Proceedings: Proceedings of Days of Diffraction
Start Page: 161
End Page: 167
Document Type: Conference-Paper
ID: 198993.0
Strain profiles in epitaxial films from X-ray Bragg diffraction phases
Authors: Vartanyants, I.; Ern, C.; Donner, W.; Dosch, H.; Caliebe, W.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Applied Physics Letters
Volume: 77
Start Page: 3929
End Page: 3931
Document Type: Article
ID: 200793.0
Entries: 1-4  
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