Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Display Documents


Institute:
Collection:
Print in Citation style Print version     Display:
Sort by: Display records with Fulltext only
Entries: 1-10  
 Basket 
Band-gap measurements of direct and indirect semiconductors using monochromated electrons
Authors: Gu, L.; Srot, V.; Sigle, W.; Koch, C.; van Aken, P. A.; Scholz, F.; Thapa, S. B.; Kirchner, C.; Jetter, M.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physical Review B
Volume: 75
Sequence Number of Article: 195214
Document Type: Article
ID: 319136.0
Band-gap measurements of direct and indirect semiconductors using monochromated electrons
Authors: Gu, L.; Srot, V.; Sigle, W.; Koch, C.; van Aken, P. A.; Scholz, F.; Thapa, S. B.; Kirchner, C.; Jetter, M.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physical Review B
Volume: 75
Sequence Number of Article: 195214
Document Type: Article
ID: 319464.0
Combined atomic force microscopy and optical microscopy measurements as a method to investigate particle uptake by cells
Authors: Javier, A. M.; Kreft, O.; Alberola, A. P.; Kirchner, C.; Zebli, B.; Susha, A. S.; Horn, E.; Kempter, S.; Skirtach, A. G.; Rogach, A. L.; Radler, J.; Sukhorukov, G. B.; Benoit, M.; Parak, W. J.
Date of Publication (YYYY-MM-DD): 2006-03
Title of Journal: Small
Volume: 2
Issue / Number: 3
Start Page: 394
End Page: 400
Document Type: Article
ID: 298259.0
EELS studies of the bandgap in GaN using monochromated electrons
Authors: Gu, L.; Srot, V.; Sigle, W.; Koch, C. T.; Scholz, F.; Kirchner, C.; Thapa, S. B.; Rühle, M.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 1484
End Page: 1484
Document Type: Conference-Paper
ID: 287720.0
EELS studies of the bandgap in GaN using monochromated electrons
Authors: Gu, L.; Srot, V.; Sigle, W.; Koch, C. T.; Scholz, F.; Kirchner, C.; Thapa, S. B.; Rühle, M.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 1484
End Page: 1484
Document Type: Conference-Paper
ID: 319734.0
Cytotoxicity of nanoparticle-loaded polymer capsules
Authors: Kirchner, C.; Javier, A. M.; Susha, A. S.; Rogach, A. L.; Kreft, O.; Sukhorukov, G. B.; Parak, W. J.
Date of Publication (YYYY-MM-DD): 2005-09-15
Title of Journal: Talanta
Volume: 67
Issue / Number: 3
Start Page: 486
End Page: 491
Document Type: Article
ID: 255444.0
Evolution of class B floral homeotic proteins: Obligate heterodimerization originated from homodimerization
Authors: Winter, K. U.; Weiser, C.; Kaufmann, K.; Bohne, A.; Kirchner, C.; Kanno, A.; Saedler, H.; Theissen, G.
Date of Publication (YYYY-MM-DD): 2002-05
Title of Journal: Molecular Biology and Evolution
Volume: 19
Issue / Number: 5
Start Page: 587
End Page: 596
Document Type: Article
ID: 28812.0
Schriften zur wirtschaftswissenschaftlichen Analyse des Rechts
Editors: Grossekettler, H.; Großfeld, B.; Hopt, Klaus J.; Kirchner, C.; Rückle, D.; Schmidt, R. H.
Place of Publication: Humblot
Publisher: Duncker & Humblot
Document Type: Series
ID: 24437.0
Schriften zur wirtschaftswissenschaftlichen Analyse des Rechts
Editors: Grossekettler, H.; Großfeld, B.; Hopt, Klaus J.; Kirchner, C.; Rückle, D.; Schmidt, R. H.
Place of Publication: Berlin
Publisher: Duncker & Humblot
Document Type: Series
ID: 122795.0
Schriften zur wirtschaftswissenschaftlichen Analyse des Rechts
Editors: Grossekettler, H.; Großfeld, B.; Hopt, Klaus J.; Kirchner, C.; Rückle, D.; Schmidt, R. H.
Place of Publication: Humblot
Publisher: Duncker & Humblot
Document Type: Series
ID: 352562.0
Entries: 1-10  
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.