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High-precision measurements in few-electron highly charged ions at the Heidelberg Electron Beam Ion Trap (EBIT)
Authors: Crespo López-Urrutia, J. R.; Braun, J.; Brenner, G.; Bruhns, H.; Draganic, I. N.; González Martínez, A. J.; Lapierre, A.; Mironov, V.; Osborne, C.; Sikler, G.; Soria Orts, R.; Tawara, H.; Ullrich, J.; Tupitsyn, I. I.; Shabaev, V. M.
Date of Publication (YYYY-MM-DD): 2005-04-01
Title of Journal: Canadian Journal of Physics
Volume: 83
Issue / Number: 4
Start Page: 387
End Page: 393
Document Type: Article
ID: 268549.0
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