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Entries: 1-10  
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Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface
Authors: Kauffmann, Y.; Oh, S. H.; Koch, C. T.; Hashibon, A.; Scheu, C.; Rühle, M.; Kaplan, W. D.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Acta Materialia
Volume: 59
Issue / Number: 11
Start Page: 4378
End Page: 4386
Document Type: Article
ID: 575331.0
Quantitative analysis of layering and in-plane structural ordering at an alumina-aluminum solid-liquid interface
Authors: Kauffmann, Y.; Oh, S. H.; Koch, C.; Hashibon, A.; Scheu, C.; Rühle, M.; Kaplan, W.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Acta Materialia
Volume: 59
Start Page: 4378
End Page: 4386
Document Type: Article
ID: 609572.0
Oscillatory mass transport in vapor-liquid-solid growth of sapphire nanowires
Authors: Oh, S. H.; Chisholm, M. F.; Kauffmann, Y.; Kaplan, W. D.; Luo, W.; Rühle, M.; Scheu, C.
Date of Publication (YYYY-MM-DD): 2010-10-22
Title of Journal: Science
Volume: 330
Start Page: 489
End Page: 493
Document Type: Article
ID: 518351.0
Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Salzberger, U.; Luerßen, B.; Janek, J.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Solid State Ionics
Volume: 181
Issue / Number: 35-36
Start Page: 1616
End Page: 1622
Document Type: Article
ID: 548066.0
Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Salzberger, U.; Luerßen, B.; Janek, J.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Solid State Ionics
Volume: 181
Issue / Number: 35-36
Start Page: 1616
End Page: 1622
Document Type: Article
ID: 548982.0
Analytical TEM investigations of Pt/YSZ interfaces
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: 14th European Microscopy Congress
Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Start Page: 369
End Page: 370
Document Type: Conference-Paper
ID: 376663.0
Analytical TEM investigations of Pt/YSZ interfaces
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: 14th European Microscopy Congress
Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Start Page: 369
End Page: 370
Document Type: Conference-Paper
ID: 394447.0
Nonreactive spreading at high temperature: molten metals and oxides on molybdenum
Authors: Saiz, E.; Tomsia, A. P.; Rauch, N.; Scheu, C.; Rühle, M.; Benhassine, M.; Seveno, D.; de Coninck, J.; Lopez-Esteban, S.
Date of Publication (YYYY-MM-DD): 2007-10-16
Title of Journal: Physical Review E
Volume: 76
Sequence Number of Article: 041602
Document Type: Article
ID: 333199.0
Control of bonding and epitaxy at copper/sapphire interface
Authors: Oh, S. H.; Scheu, C.; Wagner, T.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2007-10-03
Title of Journal: Applied Physics Letters
Volume: 91
Start Page: 141912
End Page: 141914
Document Type: Article
ID: 320804.0
First observation of a hexagonal close packed metastable intermetallic phase between Cu and Al bilayer films
Authors: Cha, L.; Scheu, C.; Richter, G.; Wagner, T.; Sturm, S.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: International Journal of Materials Research
Volume: 98
Start Page: 692
End Page: 699
Document Type: Article
ID: 319695.0
Entries: 1-10  
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