Please note that eDoc will be permanently shut down in the first quarter of 2021!      Home News About Us Contact Contributors Disclaimer Privacy Policy Help FAQ

Home
Search
Quick Search
Advanced
Fulltext
Browse
Collections
Persons
My eDoc
Session History
Login
Name:
Password:
Documentation
Help
Support Wiki
Direct access to
document ID:


          Display Documents


Institute:
Collection:
Print in Citation style Print version     Display:
Sort by: Display records with Fulltext only
Entries: 1-10  
 Basket 
Quantitative analysis of layering and in-plane structural ordering at an alumina–aluminum solid–liquid interface
Authors: Kauffmann, Y.; Oh, S. H.; Koch, C. T.; Hashibon, A.; Scheu, C.; Rühle, M.; Kaplan, W. D.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Acta Materialia
Volume: 59
Issue / Number: 11
Start Page: 4378
End Page: 4386
Document Type: Article
ID: 575331.0
Quantitative analysis of layering and in-plane structural ordering at an alumina-aluminum solid-liquid interface
Authors: Kauffmann, Y.; Oh, S. H.; Koch, C.; Hashibon, A.; Scheu, C.; Rühle, M.; Kaplan, W.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Acta Materialia
Volume: 59
Start Page: 4378
End Page: 4386
Document Type: Article
ID: 609572.0
Oscillatory mass transport in vapor-liquid-solid growth of sapphire nanowires
Authors: Oh, S. H.; Chisholm, M. F.; Kauffmann, Y.; Kaplan, W. D.; Luo, W.; Rühle, M.; Scheu, C.
Date of Publication (YYYY-MM-DD): 2010-10-22
Title of Journal: Science
Volume: 330
Start Page: 489
End Page: 493
Document Type: Article
ID: 518351.0
Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Salzberger, U.; Luerßen, B.; Janek, J.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Solid State Ionics
Volume: 181
Issue / Number: 35-36
Start Page: 1616
End Page: 1622
Document Type: Article
ID: 548066.0
Characterization of chemical composition and electronic structure of Pt/YSZ interfaces by analytical transmission electron microscopy
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Salzberger, U.; Luerßen, B.; Janek, J.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Solid State Ionics
Volume: 181
Issue / Number: 35-36
Start Page: 1616
End Page: 1622
Document Type: Article
ID: 548982.0
Analytical TEM investigations of Pt/YSZ interfaces
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: 14th European Microscopy Congress
Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Start Page: 369
End Page: 370
Document Type: Conference-Paper
ID: 376663.0
Analytical TEM investigations of Pt/YSZ interfaces
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M.
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: 14th European Microscopy Congress
Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science
Start Page: 369
End Page: 370
Document Type: Conference-Paper
ID: 394447.0
Nonreactive spreading at high temperature: molten metals and oxides on molybdenum
Authors: Saiz, E.; Tomsia, A. P.; Rauch, N.; Scheu, C.; Rühle, M.; Benhassine, M.; Seveno, D.; de Coninck, J.; Lopez-Esteban, S.
Date of Publication (YYYY-MM-DD): 2007-10-16
Title of Journal: Physical Review E
Volume: 76
Sequence Number of Article: 041602
Document Type: Article
ID: 333199.0
Control of bonding and epitaxy at copper/sapphire interface
Authors: Oh, S. H.; Scheu, C.; Wagner, T.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2007-10-03
Title of Journal: Applied Physics Letters
Volume: 91
Start Page: 141912
End Page: 141914
Document Type: Article
ID: 320804.0
First observation of a hexagonal close packed metastable intermetallic phase between Cu and Al bilayer films
Authors: Cha, L.; Scheu, C.; Richter, G.; Wagner, T.; Sturm, S.; Rühle, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: International Journal of Materials Research
Volume: 98
Start Page: 692
End Page: 699
Document Type: Article
ID: 319695.0
Entries: 1-10  
The scope and number of records on eDoc is subject to the collection policies defined by each institute - see "info" button in the collection browse view.