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Analytical TEM investigations of Pt/YSZ interfaces |
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M. | Place of Publication: Berlin [et al.] | Publisher: Springer | Date of Publication (YYYY-MM-DD): 2008 | Name of Conference/Meeting: 14th European Microscopy Congress | Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science | Start Page: 369 | End Page: 370 | Document Type: Conference-Paper | ID: 376663.0 |
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Analytical TEM investigations of Pt/YSZ interfaces |
Authors: Srot, V.; Watanabe, M.; Scheu, C.; van Aken, P. A.; Mutoro, E.; Janek, J.; Rühle, M. | Place of Publication: Berlin [et al.] | Publisher: Springer | Date of Publication (YYYY-MM-DD): 2008 | Name of Conference/Meeting: 14th European Microscopy Congress | Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 2: Materials Science | Start Page: 369 | End Page: 370 | Document Type: Conference-Paper | ID: 394447.0 |
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Control of bonding and epitaxy at copper/sapphire interface |
Authors: Oh, S. H.; Scheu, C.; Wagner, T.; Rühle, M. | Date of Publication (YYYY-MM-DD): 2007-10-03 | Title of Journal: Applied Physics Letters | Volume: 91 | Start Page: 141912 | End Page: 141914 | Document Type: Article | ID: 320804.0 |
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First observation of a hexagonal close packed metastable intermetallic phase between Cu and Al bilayer films |
Authors: Cha, L.; Scheu, C.; Richter, G.; Wagner, T.; Sturm, S.; Rühle, M. | Date of Publication (YYYY-MM-DD): 2007 | Title of Journal: International Journal of Materials Research | Volume: 98 | Start Page: 692 | End Page: 699 | Document Type: Article | ID: 319695.0 |
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