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Moving through the phase diagramm: Morphology formation in solution cast polymer-fullerene blend films for organic solar cells
Authors: Schmidt-Hansberg, B.; Sanyal, M.; Klein, M. F. G.; Pfaff, M.; Schnabel, N.; Jaiser, S.; Vorobiev, A.; Müller, E.; Colsmann, A.; Scharfer, P.; Gerthsen, D.; Lemmer, U.; Barrena, E.; Schnabel, W.
Date of Publication (YYYY-MM-DD): 2011-11
Title of Journal: ACS Nano
Volume: 5
Issue / Number: 11
Start Page: 8579
End Page: 8590
Document Type: Article
ID: 581709.0
EELS of niobium and stoichiometric niobium-oxide
phases — part I: Plasmon and near-edges fine structure
Authors: Bach, D.; Schneider, R.; Gerthsen, D.; Verbeeck, J.; Sigle, W.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Microscopy and Microanalysis
Volume: 15
Start Page: 505
End Page: 523
Document Type: Article
ID: 442627.0
Focused ion beam preparation of atome probe specimens containing a single crystallographically well-defined grain boundary
Authors: Perez-Willard, F.; Wolde-Giorgis, D.; Al-Kassab, T.; López, G. A.; Mittemeijer, E. J.; Kirchheim, R.; Gerthsen, D.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Micron
Volume: 39
Start Page: 45
End Page: 52
Document Type: Article
ID: 372296.0
EELS investigations of reference niobium oxides and anodically grown niobium oxide layers
Authors: Bach, D.; Störmer, H.; Schneider, R.; Gerthsen, D.; Sigle, W.
Place of Publication: New York, USA
Publisher: Cambridge University Press
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: Microscopy and Microanalysis 2007
Title of Proceedings: Microscopy and Microanalysis 2007
Start Page: 1274CD
End Page: 1275CD
Document Type: Conference-Paper
ID: 319198.0
Optimizing phase contrast in transmission electron microscopy with an electrostatic (Boersch) phase plate
Authors: Majorovits, E.; Barton, B.; Schultheiß, K.; Pérez-Willard, F.; Gerthsen, D.; Schröder, R. R.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Ultramicroscopy
Volume: 107
Start Page: 213
End Page: 226
Document Type: Article
ID: 331258.0
Towards quantification of the In-distribution in InGaAs quantum dots.
Authors: Blank, H.; Litviniv, D.; Schneider, R.; Gerthsen, D.; Passow, T.; Scheerschmidt, K.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Microscopy and Microanalysis
Volume: 13
Issue / Number: 3
Start Page: 318
End Page: 319
Document Type: Article
ID: 350152.0
Fabrication of a Boersch phase plate for phase contrast imaging in a transmission electron microscope
Authors: Schultheiß, K.; Pérez-Willard, F.; Barton, B.; Gerthsen, D.; Schröder, R. R.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Review of Scientific Instruments
Volume: 77
Start Page: 33701
End Page: 33704
Document Type: Article
ID: 305063.0
Structural and chemical analysis of CdSe/ZnSe nanostructures by transmission electron microscopy
Authors: Peranio, N.; Rosenauer, A.; Gerthsen, D.; Sorokin, S.V.; Sedova, I.V.; Ivanov, S.V.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Physical Review B
Volume: 61
Sequence Number of Article: 16015
Document Type: Article
ID: 321495.0
Structural and chemical analysis of CdSe islands in a ZnSe matrix by transmission electron microscopy
Authors: Gerthsen, D.; Rosenauer, A.; Litvinov, D.; Peranio, N.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Journal of Crystal Growth
Volume: 214/215
Sequence Number of Article: 707
Document Type: Article
ID: 321498.0
Investigation of CdSe/ZnSe quantum dot structures by composition evaluation by lattice fringe analysis
Authors: Rosenauer, A.; Peranio, N.; Gerthsen, D.
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Microscopy of Semiconducting Materials 1999
Start Page: 117
End Page: 120
Document Type: Article
ID: 321579.0
Entries: 1-10  
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