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The MOS-type DEPFET pixel sensor for the ILC environment
Authors: Andricek, L.; Fischer, P.; Heinzinger, K.; Herrmann, S.; Herz, D.; Karagounis, M.; Kohrs, R.; Krüger, H.; Lechner, P.; Lutz, G.; Moser, H. G.; Peric, I.; Reuen, L.; Richter, R. H.; Sandow, C.; Schnecke, M.; Schopper, F.; Strüder, L.; Törne, E. V.; Treis, J.; Trimpl, M.; Velthuis, J.; Wermes, N.; Wölfel, S.
Date of Publication (YYYY-MM-DD): 2006-09-01
Name of Conference/Meeting: International Workshop on Semiconductor Pixel Detectors for Particles and Imaging
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume (in Journal): 565
Issue / Number: 1
Start Page: 165
End Page: 171
Document Type: Conference-Paper
ID: 288742.0
 
Full text / Content available
The MOS-Type DEPFET Pixel Sensor for the ILC Environment
Authors: Andricek, L.; Fischer, P.; Heinzinger, K.; Herrmann, S.; Herz, D.; Karagounis, M.; Kohrs, R.; Krüger, H.; Lechner, P.; Lutz, G.; Moser, H. -G.; Peric, I.; Reuen, L.; et al.
Document Type: Conference-Paper
ID: 543891.0
Entries: 1-2  
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