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Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
Authors: Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 379
End Page: 383
Document Type: Conference-Paper
ID: 458868.0
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