|
|
|
|
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications |
Authors: Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E. | Date of Publication (YYYY-MM-DD): 2010 | Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy | Title of Journal: Journal of Microscopy | Volume (in Journal): 237 | Issue / Number: 3 | Start Page: 379 | End Page: 383 | Document Type: Conference-Paper | ID: 458868.0 |
|
|
The scope and number of records on eDoc is subject
to the collection policies defined by each institute
- see "info" button in the collection browse view.
|
|