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Entries: 1-10  
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Energy resolution of a Omega-type monochromator and imaging properties of the MANDOLINE filter
Authors: Essers, E.; Benner, G.; Mandler, T.; Meyer, S.; Mittmann, D.; Schnell, M.; Höschen, R.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: International Workshop on Enhanced Data Generated by Electrons (EDGE 2009)
Title of Journal: Ultramicroscopy
Volume (in Journal): 110
Issue / Number: 8
Start Page: 971
End Page: 980
Document Type: Conference-Paper
ID: 494352.0
The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM
Authors: van Aken, P. A.; Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.
Place of Publication: New York, USA
Publisher: Cambridge University Press
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: Microscopy and Microanalysis 2007
Title of Proceedings: Microscopy and Microanalysis 2007
Start Page: 862CD
End Page: 863CD
Document Type: Conference-Paper
ID: 319189.0
The sub-electron-volt-sub-Angstrom-microscope (SESAM): Pushing the limits in monochromated and energy-filtered TEM
Authors: van Aken, P. A.; Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.
Place of Publication: New York, USA
Publisher: Cambridge University Press
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: Microscopy and Microanalysis 2007
Title of Proceedings: Microscopy and Microanalysis 2007
Start Page: 862CD
End Page: 863CD
Document Type: Conference-Paper
ID: 319415.0
Analytical performance of the SESAM microscope
Authors: Essers, E.; Matijevic, M.; Benner, G.; Höschen, R.; Sigle, W.; Koch, C.
Date of Publication (YYYY-MM-DD): 2007
Name of Conference/Meeting: 33rd Microscopy Conference MC 2007 - DGE Tagung (Deutsche Gesellschaft für Elektronenmikroskopie e.V.)
Title of Journal: Microscopy & Microanalysis
Volume (in Journal): 13
Issue / Number: Suppl. 3
Start Page: 18
End Page: 19
Document Type: Conference-Paper
ID: 320730.0
SESAM: Exploring the frontiers of electron microscopy
Authors: Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.
Date of Publication (YYYY-MM-DD): 2006-12
Title of Journal: Microscopy and Microanalysis
Volume: 12
Issue / Number: 6
Start Page: 506
End Page: 514
Document Type: Article
ID: 297854.0
SESAM: Exploring the frontiers of electron microscopy
Authors: Koch, C. T.; Sigle, W.; Höschen, R.; Rühle, M.; Essers, E.; Benner, G.; Matijevic, M.
Date of Publication (YYYY-MM-DD): 2006-12
Title of Journal: Microscopy and Microanalysis
Volume: 12
Issue / Number: 6
Start Page: 506
End Page: 514
Document Type: Article
ID: 297855.0
Requisites for ultimate energy resolution EELS and band gap measurements in TEM
Authors: Essers, E.; Höschen, R.; Matijevic, M.; Benner, G.; Koch, C. T.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 810
End Page: 810
Document Type: Conference-Paper
ID: 287718.0
Low-loss electron spectroscopy using monochromated electrons
Authors: Sigle, W.; Srot, V.; Gu, L.; Koch, C. T.; Höschen, R.; Essers, E.; Matijevic, M.; Benner, G.; Thesen, A.; Rühle, M.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 811
End Page: 811
Document Type: Conference-Paper
ID: 287719.0
Low-loss electron spectroscopy using monochromated electrons
Authors: Sigle, W.; Srot, V.; Gu, L.; Koch, C. T.; Höschen, R.; Essers, E.; Matijevic, M.; Benner, G.; Thesen, A.; Rühle, M.
Publisher: International Federation of Societies in Microscopy
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: 16th International Microscopy Congress - IMC16
Title of Proceedings: Proceedings of the 16th International Microscopy Congress 2006
Start Page: 811
End Page: 811
Document Type: Conference-Paper
ID: 319827.0
Requisites for ultimate energy resolution EELS and band gap measurements
Authors: Essers, E.; Höschen, R.; Matijevic, M.; Benner, G.; Koch, C. T.
Date of Publication (YYYY-MM-DD): 2006
Name of Conference/Meeting: Microscopy and Microanalysis 2006
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 12
Issue / Number: Suppl. 2: Proceedings
Start Page: 1148
End Page: 1149
Document Type: Conference-Paper
ID: 378649.0
Entries: 1-10  
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