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Characterization of the microstructure of Al-rich TiAl-alloys by combined TEM imaging techniques
Authors: Kelm, K.; Irsen, S.; Quandt, E.; Paninski, M.; Drevermann, A.; Schmitz, G. J; Palm, M.; Stein, F.; Heilmaier, M.; Engberding, N.; Saage, H.; Sturm, D.
(Start) Date of Conference/Meeting
(YYYY-MM-DD):
 2007-09-02
Name of Conference/Meeting: 33rd Conference of the DGE Deutsche Gesellschaft für Elektronenmikroskopie e.V.
Place of Conference/Meeting: Saarbrücken, Germany
Document Type: Talk at Event
ID: 343267.0
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