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A DEPFET Based Beam Telescope with Submicron Precision Capability
Authors: Velthuis, J. J.; Drasal, Z.; Hanninger, G.; Kohrs, R.; Mathes, M.; Reuen, L.; Scheireich, D.; Andricek, L.; Pascual, I. C.; Chen, X.; Dolezal, Z.; Fischer, P.; Frey, A.; Fuster, J. A.; Koch, M.; Kodys, P.; Kvasnicka, P.; Krueger, H.; Llacer, C. L.; Lodomez, P.; Moser, H. G.; Peric, I.; Raspereza, A.; Richter, R.; Rummel, S.; von Toerne, E.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: IEEE Transactions on Nuclear Science
Issue / Number: 55
Start Page: 662
End Page: 666
Document Type: Conference-Paper
ID: 543289.0
Status of DEPFET
Authors: Velthuis, J.J.; Kohrs, R.; Reuen, L.; Treis, J.; Zhang, C.; Andricek, L.; Fischer, P.; Giesen, F.; Krüger, H.; Lutz, G.; Mathes, M.; Moser, H. G.; Peric, I.; Richter, R.H.; Sandow, C.; Strüder, L.; von Törne, E.; Trimpl, M.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2006-12-10
Name of Conference/Meeting: VERTEX2005: 14th International Workshop on Vertex Detectors
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume (in Journal): 568
Issue / Number: 1
Start Page: 57
End Page: 60
Document Type: Conference-Paper
ID: 304024.0
 
Full text / Content available
Performance of a DEPFET pixel system for particle detection
Authors: Trimpl, M.; Andricek, L.; Fischer, P.; Kohrs, R.; Krüger, H.; Lutz, G.; Moser, H. G.; Peric, I.; Reuen, L.; Richter, R. H.; Sandow, C.; Strüder, L.; Treis, J.; von Törne, E.; Velthuis, J. J.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2006-11-30
Name of Conference/Meeting: 10th European Symposium on Semiconductor Detectors
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume (in Journal): 568
Issue / Number: 1
Start Page: 201
End Page: 206
Document Type: Conference-Paper
ID: 294097.0
 
Full text / Content available
White paper report on: Using nuclear reactors to search for a value of θ13
Authors: Anderson, K.; Anjos, J.C; Ayres, D.; Beacom, J.; Bediaga, I.; de Bellefon, A.; Berger, B.E.; Buck, C.; Bugg, W.; Busenitz, J.; Choubey, S.; Conrad, J.; Cribier, M.; Dadoun, O.; Dalnoki-Veress, F.; Decowski, M.; de Gouvêa, A.; Demuth, D.; Dessages-Ardellier, F.; Efremenko, Y.; von Feilitzsch, F.; Finley, D.; Formaggio, J.A.; Freedman, S.J.; Fujikawa, B.K.; Garbini, M.; Giusti, P.; Goger-Neff, M.; Goodman, M.; Gray, F.; Grieb, C.; Grudzinski, J.J.; Guarino, V.J.; Hartmann, F.; Hagner, C.; Heeger, K.M.; Hofmann, W.; Horton-Smith, G.; Huber, P.; Inzhechik, L.; Jochum, J.; Jostlein, H.; Kadel, R.; Kamyshkov, Y.; Kaplan, D.; Kasper, P.; de Kerret, H.; Kersten, J.; Klein, J.; Knöpfle, K.T.; Kopeikin, V.; Kozlov, Yu.; Kryn, D.; Kuchler, V.; Kuze, M.; Lachenmaier, T.; Lasserre, T.; Laughton, C.; Lendvai, C.; Li, J.; Lindner, M.; Link, J.; Longo, M.; Lu, Y.S.; Luk, K.B.; Ma, Y.Q.; Martemyanov, V.P.; Mauger, C.; Menghetti, H.; McKeown, R.; Mention, G.; Meyer, J.P.; Mikaelyan, L.; Minakata, H.; Naples, D.; Nunokawa, H.; Oberauer, L.; Obolensky, M.; Parke, S.; Petcov, S.T.; Peres, O.L.G.; Potzel, W.; Pilcher, J.; Plunkett, R.; Raffelt, G.; Rapidis, P.; Reyna, D.; Roe, B.; Rolinec, M.; Sakamoto, Y.; Sartorelli, G.; Schönert, S.; Schwetz, T.; Selvi, M.; Shaevitz, M.; Shellard, R.; Shrock, R.; Sidwell, R.; Sims, J.; Sinev, V.; Stanton, N.; Stancu, I.; Stefanski, R.; Suekane, F.; Sugiyama, H.; Sukhotin, S.; Sumiyoshi, T.; Svoboda, R.; Talaga, R.; Tamura, N.; Tanimoto, M.; Thron, J.; von Toerne, E.; Vigaud, D.; Wagner, C.; Wang, Y.F.; Wang, Z.; Winter, W.; Wong, H.; Yakushev, E.; Yang, C.G.; Yasuda, O.
Publisher: International Reactor theta_13 Working Group
Date of Publication (YYYY-MM-DD): 2004
Document Type: Conference-Paper
ID: 62682.0
 
Full text / Content available
DEPFET Active Pixel Detectors
Authors: Moser, H. -G.; Andricek, L.; Chen, X.; Frey, A.; Lutz, G.; Richter, R. H.; Schnecke, M.; Raspereza, A.; Rummel, S.; Feld, L.; Jussen, R.; Karpinski, W.; Hettkamp, P.; Kohrs, R.; Karagounis, M.; Koch, M.; Krueger, H.; Lodomez, P.; Mathes, M.; Reuen, L.; Sandow, C.; Schneider, J.; von Toerne, E.; Trimpl, M.; Velthuis, J.; Wermes, N.; de Boer, W.; Bol, J.; Sabellek, A.; Fischer, P.; Giesen, G.; Kreidel, C.; Peric, I.; Treis, J.; Schopper, F.; Strueder, L.; Dolezal, Z.; Drasal, Z.; Kodys, P.; Kvasnicka, P.; Scheirich, D.; Carbonell, I.; Fuster, J.; Lacasta, C.; Marinas, C.; Vos, M.
Document Type: Conference-Paper
ID: 544442.0
Entries: 1-5  
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