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Entries: 1-5  
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Double aberration correction in a low-energy electron microscope
Authors: Schmidt, Thomas; Marchetto, Helder; Lévesque, Pierre L.; Groh, Ulli; Maier, Florian; Preikszas, Dirk; Hartel, Peter; Spehr, Rainer; Lilienkamp, Gerhard; Engel, Wilfried; Fink, Rainer; Bauer, Ernst; Rose, Harald; Umbach, Eberhard; Freund, Hans-Joachim
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Ultramicroscopy
Volume: 110
Issue / Number: 11
Start Page: 1358
End Page: 1361
Document Type: Article
ID: 442817.0
Influence of substrate morphology on organic layer growth: PTCDA on Ag(111)
Authors: Marchetto, Helder; Groh, Ullrich; Schmidt, Thomas; Fink, Rainer; Freund, Hans-Joachim; Umbach, Eberhard
Date of Publication (YYYY-MM-DD): 2006-06-09
Title of Journal: Chemical Physics
Volume: 325
Issue / Number: 1
Start Page: 178
End Page: 184
Document Type: Article
ID: 281442.0
Flat conduction-band alignment at the CdS/CuInSe2 thin-film solar-cell heterojunction
Authors: Morkel, Matthias; Weinhardt, L.; Lohmuller, B.; Heske, Clement; Umbach, Eberhard; Riedl, W.; Zweigart, S.; Karg, F.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Applied Physics Letters
Volume: 79
Issue / Number: 27
Start Page: 4482
End Page: 4484
Document Type: Article
ID: 13414.0
Concept and design of the SMART spectromicroscope at BESSY II
Editors: Thieme, Jürgen; Schmahl, Günter; Rudolph, Dietbert; Umbach, Eberhard
Authors: Engel, W.; Degenhardt, Ralf; Bradshaw, Alexander M.; Erlebach, Wolfgang; Ihmann, Klaus; Kuhlenbeck, Helmut; Wichtendahl, R.; Freund, Hans-Joachim; Schlögl, Robert; Preikszas, D.; Rose, H.; Spehr, R.; Hartel, P.; Lilienkamp, G.; Schmidt, T.; Bauer, E.; Benner, G.; Fink, R.; Weiss, M. R.; Umbach, Eberhard
Title of Book: X-Ray Microscopy and Spectromicroscopy
Start Page: III-55
End Page: III-66
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 1998
Document Type: InBook
ID: 2015.0
Concept and design of the SMART spectromicroscope at BESSY II
Editors: Thieme, Jürgen; Schmahl, Günter; Rudolph, Dietbert; Umbach, Eberhard
Authors: Engel, W.; Degenhardt, Ralf; Bradshaw, Alexander M.; Erlebach, Wolfgang; Ihmann, Klaus; Kuhlenbeck, Helmut; Wichtendahl, R.; Freund, Hans-Joachim; Schlögl, Robert; Preikszas, D.; Rose, H.; Spehr, R.; Hartel, P.; Lilienkamp, G.; Schmidt, T.; Bauer, E.; Benner, G.; Fink, R.; Weiss, M. R.; Umbach, Eberhard
Title of Book: X-Ray Microscopy and Spectromicroscopy
Start Page: III-55
End Page: III-66
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 1998
Document Type: InBook
ID: 2015.0
Entries: 1-5  
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