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Elastic light scattering from free sub-micron particles in the soft X-ray regime
Authors: Bresch, H.; Wassermann, B.; Langer, Burkhard; Graf, C.; Flesch, Roman; Becker, Uwe; Österreicher, B.; Leisner, T.; Rühl, Eckart
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Faraday Discussions
Volume: 137
Start Page: 389
End Page: 402
Document Type: Article
ID: 319492.0
 
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Charging Mechanisms of Trapped, Element-Selectively Excited
Nanoparticles Exposed to Soft X Rays
Authors: Grimm, Michael; Langer, Burkhard; Schlemmer, Stephan; Lischke, Toralf; Becker, Uwe; Widdra, Wolf; Gerlich, Dieter; Flesch, Roman; Rühl, Eckart
Date of Publication (YYYY-MM-DD): 2006-02-13
Title of Journal: Physical Review Letters
Volume: 96
Start Page: 066801-1
End Page: 066801-4
Document Type: Article
ID: 249559.0
 
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New setup to study trapped nano-particles using synchrotron radiation
Authors: Grimm, M.; Langer, Burkhard; Schlemmer, S.; Lischke, Toralf; Widdra, Wolf; Gerlich, D.; Becker, Uwe; Rühl, Eckart
Place of Publication: Melville
Publisher: AIP Press
Date of Publication (YYYY-MM-DD): 2004
Name of Conference/Meeting: Eight International Conference on Synchrotron Radiation Instrumentation
Title of Proceedings: SYNCHROTRON RADIATION INSTRUMENTATION: Eighth International Conference on Synchrotron Radiation Instrumentation
Start Page: 1062
End Page: 1065
Title of Series: AIP Conference Proceedings
Volume (in Series): 705
Document Type: Conference-Paper
ID: 220233.0
Entries: 1-3  
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