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Entries: 1-10  
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Metal-catalyzed growth of semiconductor nanostructures without solubility and diffusivity constraints
Authors: Wang, Z. M.; Gu, L.; Phillipp, F.; Wang, J. Y.; Jeurgens, L. P. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Advanced Materials
Volume: 23
Issue / Number: 7
Start Page: 854
End Page: 859
Document Type: Article
ID: 563006.0
The Stuttgart Center for Electron Microscopy at the Max Planck Institute for Metals Research
Authors: van Aken, P. A.; Jin-Phillipp, N. Y.; Koch, C. T.; Ögüt, B.; Özdöl, V. B.; Phillipp, F.; Rahmati, B.; Sigle, W.; Srot, V.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: International Journal of Materials Research
Volume: 102
Start Page: 815
End Page: 827
Document Type: Article
ID: 570147.0
Metal-catalyzed growth of semiconductor nanostructures without solubility and diffusivity constraints
Authors: Wang, Z.; Gu, L.; Phillipp, F.; Wang, J. Y.; Jeurgens, L. P. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Advanced Materials
Volume: 23
Start Page: 854
End Page: 859
Document Type: Article
ID: 579657.0
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
Authors: Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 379
End Page: 383
Document Type: Conference-Paper
ID: 458868.0
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers
Authors: Łaszcz, A.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Phillipp, F.; van Aken, P. A.; Katcki, J.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 347
End Page: 351
Document Type: Conference-Paper
ID: 458891.0
Characterization of ytterbium silicide formed in ultra high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: 16th International Conference on Microscopy of Semiconducting Materials
Title of Journal: Journal of Physics: Conference Series
Volume (in Journal): 209
Sequence Number: 012056
Document Type: Conference-Paper
ID: 466661.0
High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si
Authors: Wang, Z.; Jeurgens, L. P. H.; Wang, J. Y.; Phillipp, F.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2009-11
Title of Journal: Journal of Materials Research
Volume: 24
Issue / Number: 11
Start Page: 3294
End Page: 3299
Document Type: Article
ID: 438876.0
High-temperature structural phase transition in Ca2Fe2O5 studied by in-situ X-ray diffraction and transmission electron microscopy
Authors: Krüger, H.; Kahlenberg, V.; Petříček, V.; Phillipp, F.; Wertl, W.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Journal of Solid State Chemistry
Volume: 182
Start Page: 1515
End Page: 1523
Document Type: Article
ID: 430212.0
Reflow ageing influences and wettability effects of immersion tin final finishes with lead-free solder
Authors: Hetschel, T.; Wolter, K.-J.; Phillipp, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Circuit World
Volume: 35
Issue / Number: 2
Start Page: 37
End Page: 44
Document Type: Article
ID: 432294.0
Strain measurements on Si/SiGe heterostructures using HRTEM
Authors: Özdöl, V. B.; Koch, C. T.; Phillipp, F.; van Aken, P. A.
Place of Publication: Graz
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 3: Materials Science
Start Page: 447
End Page: 448
Document Type: Conference-Paper
ID: 435834.0
Entries: 1-10  
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