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Entries: 1-8  
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Biochemical, molecular and preclinical characterization of a double-virus-reduced human butyrylcholinesterase preparation designed for clinical use
Authors: Weber, A.; Butterweck, H.; Mais-Paul, U.; Teschner, W.; Lei, L.; Muchitsch, E. M.; Kolarich, D.; Altmann, F.; Ehrlich, H. J.; Schwarz, H. P.
Date of Publication (YYYY-MM-DD): 2011-04
Title of Journal: Vox Sanguinis
Volume: 100
Issue / Number: 3
Start Page: 285
End Page: 297
Document Type: Article
ID: 562337.0
 
Full text / Content available
Lock-in infrared microscopy with 1.4 ${\mu}$m resolution using a solid
immersion lens
Authors: Breitenstein, O.; Altmann, F.; Riediger, T.; Karg, D.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Electronic Device Failure Analysis
Volume: 8
Issue / Number: 2
Start Page: 4
End Page: 13
Document Type: Article
ID: 312879.0
Lock-in thermal IR imaging using a solid immersion lens
Authors: Breitenstein, O.; Altmann, F.; Riediger, T.; Karg, D.; Gottschalk, V.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Microelectronics Reliability
Volume: 46
Issue / Number: 9-11
Start Page: 1508
End Page: 1513
Document Type: Article
ID: 312841.0
Use of a solid immersion lens for thermal IR imaging
Authors: Breitenstein, O.; Altmann, F.; Riediger, T.; Karg, D.; Gottschalk, V.
Place of Publication: Ohio
Publisher: ASM International
Date of Publication (YYYY-MM-DD): 2006
Title of Proceedings: Proceedings 32nd International Symposium for Testing and Failure
Analysis (ISTFA 2006)
Start Page: 382
End Page: 388
Document Type: Conference-Paper
ID: 312764.0
Inversion of microscopic lock-in thermograms in the presence of emissivity contrast
Authors: Breitenstein, O.; Altmann, F.
Place of Publication: Quebec, Canada
Publisher: Universit‚ Laval
Date of Publication (YYYY-MM-DD): 2005
Name of Conference/Meeting: V International Workshop "Advances in Signal Processing for Non-Destructive Evaluation of Materials"
Title of Proceedings: Proceedings V International Workshop "Advances in Signal Processing for Non-Destructive Evaluation of Materials"
Start Page: 59
Document Type: Conference-Paper
ID: 275397.0
New developments in IR lock-in IR thermography
Authors: Breitenstein, O.; Rakotoniaina, J.P.; Hejjo, Al Rifai; Gradhand, M.; Altmann, F.; Riediger, T.
Publisher: ASM International
Date of Publication (YYYY-MM-DD): 2004
Title of Proceedings: Proceedings 30th International Symposium for Testing and Failure Analysis (ISTFA 2004)
Start Page: 595
End Page: 599
Document Type: Conference-Paper
ID: 223984.0
Thermal failure analysis by IR lock-in thermography
Authors: Breitenstein, O.; Rakotoniaina, J.P.; Altmann, F.; Riediger, T.; Schreer, O.
Publisher: ASM International
Date of Publication (YYYY-MM-DD): 2004
Title of Proceedings: Microelectronic Failure Analysis Desk Reference, Fifth Edition
Start Page: 398
End Page: 405
Document Type: Conference-Paper
ID: 223987.0
Lock-in IR-thermography - A novel tool for material and device characterization
Authors: Huth, St; Breitenstein, O.; Huber, A.; Dantz, D.; Lambert, U.; Altmann, F.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Solid State Phenomena
Volume: 82-84
Start Page: 741
End Page: 746
Document Type: Article
ID: 33414.0
Entries: 1-8  
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