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Femtosecond free−electron laser x−ray diffraction
data sets for algorithm development
Authors: Kassemeyer, Stephan; Steinbrener, Jan; Lomb, Lukas; Hartmann, Elisabeth; Aquila, Andrew; Barty, Anton; Martin, Andrew V.; Hampton, Christina Y.; Bajt, Saša; Barthelmess, Miriam; Barends, Thomas; Bostedt, Christoph; Bott, Mario; Bozek, John D.; Coppola, Nicola; Cryle, Max; DePonte, Daniel P.; Doak, R. Bruce; Epp, Sascha W.; Erk, Benjamin; Fleckenstein, Holger; Foucar, Lutz; Graafsma, Heinz; Gumprecht, Lars; Hartmann, Andreas; Hartmann, Robert; Hauser, Günter; Hirsemann, Helmut; Hömke, André; Holl, Peter; Jönsson, Olof; Kimmel, Nils; Krasniqi, Faton; Liang, Mengning; Maia, Filipe R.N.C.; Marchesini, Stefano; Nass, Karol; Reich, Christian; Rolles, Daniel; Rudek, Benedikt; Rudenko, Artem; Schmidt, Carlo; Schulz, Joachim; Shoeman, Robert L.; Sierra, Raymond G.; Soltau, Heike; Spence, John C. H.; Starodub, Dmitri; Stellato, Francesco; Stern, Stephan; Stier, Gunter; Svenda, Martin; Weidenspointner, Georg; Weierstall, Uwe; White, Thomas A.; Wunderer, Cornelia B.; Frank, Matthias; Chapman, Henry N.; Joachim, Ullrich; Strüder, Lothar; Bogan, Michael J.; Schlichting, Ilme
Date of Publication (YYYY-MM-DD): 2012-02-13
Title of Journal: Optics Express
Volume: 20
Issue / Number: 4
Start Page: 4149
End Page: 4158
Document Type: Article
ID: 638121.0
Time−resolved protein nanocrystallography
using an X−ray free−electron laser
Authors: Aquila, Andrew; Hunter, Mark S.; Doak, R. Bruce; Kirian, Richard A.; Fromme, Petra; White, Thomas A.; Andreasson, Jakob; Arnlund, David; Bajt, Saša; Barends, Thomas; Barthelmess, Miriam; Bogan, Michael J.; Bostedt, Christoph; Bottin, Hervé; Bozek, John D.; Caleman, Carl; Coppola, Nicola; Davidsson, Jan; DePonte, Daniel P.; Elser, Veit; Epp, Sascha W.; Erk, Benjamin; Fleckenstein, Holger; Foucar, Lutz; Frank, Matthias; Fromme, Raimund; Graafsma, Heinz; Grotjohann, Ingo; Gumprecht, Lars; Hajdu, Janos; Hampton, Christina Y.; Hartmann, Andreas; Hartmann, Robert; Hau−Riege, Stefan P.; Hauser, Günter; Hirsemann, Helmut; Holl, Peter; Holton, James M.; Hömke, André; Johansson, Linda; Kimmel, Nils; Kassemeyer, Stephan; Krasniqi, Faton; Kühnel, Kai−Uwe; Liang, Mengning; Lomb, Lukas; Malmerberg, Erik; Marchesini, Stefano; Martin, Andrew V.; Maia, Filipe R.N.C.; Messerschmidt, Marc; Nass, Karol; Reich, Christian; Neutze, Richard; Rolles, Daniel; Rudek, Benedikt; Rudenko, Artem; Schlichting, Ilme; Schmidt, Carlo; Schmidt, Kevin E.; Schulz, Joachim; Seibert, M. Marvin; Shoeman, Robert L.; Sierra, Raymond G.; Soltau, Heike; Starodub, Dmitri; Stellato, Francesco; Stern, Stephan; Strüder, Lothar; Timneanu, Nicusor; Ullrich, Joachim; Wang, Xiaoyu; Williams, Garth J.; Weidenspointner, Georg; Weierstall, Uwe; Wunderer, Cornelia B.; Barty, Anton; Spence, John C. H.; Chapman, Henry N.
Date of Publication (YYYY-MM-DD): 2012-01-30
Title of Journal: Optics Express
Volume: 20
Issue / Number: 3
Start Page: 2706
End Page: 2716
Document Type: Article
ID: 638139.0
Entries: 1-2  
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