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Atomic force microscopy studies of oxide thin films on organic self-assembled monolayers
Authors: Niesen, Thomas P.; De Guire, Mark R.; Bill, Joachim; Aldinger, Fritz; Rühle, Manfred; Fischer, Armin; Jentoft, Friederike C.; Schlögl, Robert
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Journal of Materials Research
Volume: 14
Issue / Number: 6
Start Page: 2464
End Page: 2475
Document Type: Article
ID: 1250.0
Characterization of thin films containing zirconium, oxygen, and sulfur by scanning electron and atomic force microscopy
Authors: Fischer, Armin; Jentoft, Friederike C.; Weinberg, Gisela; Schlögl, Robert; Niesen, Thomas P.; Bill, Joachim; Aldinger, Fritz; De Guire, Mark R.; Ruehle, Manfred
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Journal of Materials Research
Volume: 14
Issue / Number: 9
Start Page: 3725
End Page: 3733
Document Type: Article
ID: 1251.0
 
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