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Characterization of ytterbium silicide formed in ultra high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: 16th International Conference on Microscopy of Semiconducting Materials
Title of Journal: Journal of Physics: Conference Series
Volume (in Journal): 209
Sequence Number: 012056
Document Type: Conference-Paper
ID: 466661.0
HRTEM characterization of erbium silicide formed in ultra-high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Place of Publication: Graz
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 3: Materials Science
Start Page: 31
End Page: 32
Document Type: Conference-Paper
ID: 435835.0
Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO2/Si structure
Authors: Laszcz, A.; Ratajczak, J.; Czerwinski, A.; Katcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Breil, N.; Larrieu, G.; Dubois, E.
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: E-MRS Spring Meeting 2008
Title of Journal: Materials Science and Engineering B
Volume (in Journal): 154–155
Start Page: 175
End Page: 178
Document Type: Conference-Paper
ID: 394967.0
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures
Authors: Katcki, J.; Ratajczak, J.; Laszcz, A.; Phillipp, F.; Dubois, E.; Larrieu, G.; Penaud, J.; Baie, X.
Place of Publication: London
Publisher: Institute of Physics
Date of Publication (YYYY-MM-DD): 2003
Name of Conference/Meeting: Microscopy of Semiconducting Materials 2003
Title of Proceedings: Microscopy of Semiconducting Materials 2003
Start Page: 479
End Page: 482
Title of Series: Institute of Physics Conference Series
Volume (in Series): 180
Document Type: Conference-Paper
ID: 169749.0
Entries: 1-4  
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