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Entries: 1-9  
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Plasmon energy chemical phase mapping of reactive mutilayers
Authors: Mat Yajid, M. A.; Wagner, T.; Moebus, G.
Date of Publication (YYYY-MM-DD): 2008
Title of Journal: Physica Status Solidi (RRL) - Rapid Research Letters
Volume: 2
Issue / Number: 1
Start Page: 7
End Page: 9
Document Type: Article
ID: 377768.0
Nanobeam propagation and imaging in a FEGTEM/STEM
Authors: Möbus, G.; Nufer, S.
Date of Publication (YYYY-MM-DD): 2003-09
Title of Journal: Ultramicroscopy
Volume: 96
Issue / Number: 3-4
Start Page: 285
End Page: 298
Document Type: Article
ID: 112699.0
Analysis of mismatched heterointerfaces by combinded HREM image processing and modeling
Authors: Möbus, G.; Levay, A.; Inkson, B. J.; Hytch, M.; Trampert, A.; Wagner, T.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Zeitschrift für Metallkunde
Volume: 94
Start Page: 358
End Page: 367
Document Type: Article
ID: 51193.0
3-D focused ion beam mapping of nanoindentation zones in a Cu- Ti multilayered coating
Authors: Steer, T. J.; Möbus, G.; Kraft, O.; Wagner, T.; Inkson, B. J.
Date of Publication (YYYY-MM-DD): 2002-06-24
Title of Journal: Thin Solid Films
Volume: 413
Issue / Number: 1-2
Start Page: 147
End Page: 154
Document Type: Article
ID: 6740.0
 
Full text / Content available
Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy
Authors: Inkson, B. J.; Steer, T.; Möbus, G.; Wagner, T.
Date of Publication (YYYY-MM-DD): 2001-02
Title of Journal: Journal of Microscopy
Volume: 201
Start Page: 256
End Page: 269
Document Type: Article
ID: 21785.0
 
Full text / Content available
Subsurface nanoindentation deformation of Cu-Al multilayers mapped in 3D by focused ion beam microscopy
Authors: Inkson, B. J.; Steer, T.; Möbus, G.; Wagner, T.
Date of Publication (YYYY-MM-DD): 2001-02
Title of Journal: Journal of Microscopy
Volume: 201
Start Page: 256
End Page: 269
Document Type: Article
ID: 123003.0
Is atomic resolution EELS possible?
Authors: Möbus, G.; Nufer, S.
Place of Publication: Bristol
Publisher: IOP Publishing Ltd.
Date of Publication (YYYY-MM-DD): 2001
Name of Conference/Meeting: Electron microscopy and analysis 2001
Title of Proceedings: Electron microscopy and analysis 2001. Proceedings of the Institute of Physics Electron Microscopy and Analysis Group conference
Start Page: 151
End Page: 154
Title of Series: Institute of Physics Conference Series
Volume (in Series): 168
Document Type: Conference-Paper
ID: 24126.0
3D FIB and AFM mapping of nanoindentation zones
Authors: Steer, T. J.; Möbus, G.; Kraft, O.; Wagner, T.; Inkson, B. J.
Place of Publication: Boston, Mass.
Publisher: MRS
Date of Publication (YYYY-MM-DD): 2001
Name of Conference/Meeting: Fundamentals of Nanoidentation and Nanotribology II
Title of Proceedings: Fundamentals of Nanoidentation and Nanotribology II
Start Page: Q3.7.1
End Page: Q3.7.6
Title of Series: Materials Research Society Symposium Proceedings
Volume (in Series): 649
Document Type: Conference-Paper
ID: 25896.0
 
Full text / Content available
Probability calculus for quantitative HREM. Part I: Monte-Carlo and point cloud techniques
Authors: Möbus, G.; Kienzle, O.
Date of Publication (YYYY-MM-DD): 2000-12
Title of Journal: Ultamicroscopy
Volume: 85
Start Page: 183
End Page: 198
Document Type: Article
ID: 204323.0
Entries: 1-9  
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