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First results from MIRI verification model testing
Authors: Lim, T.; Alvarez, J. L.; Bauwens, E.; Garcia Bedregal, A.; Blommaert, J.; Dannerbauer, H.; Eccleston, P.; Ferlet, M.; Fischer, S.; Garcia-Marin, M.; Glasse, A.; Glauser, A. M.; Gordon, K.; Greene, T.; Grundy, T.; Hennemann, M.; Klaas, U.; Labiano, A.; Lahuis, F.; Martínez-Galarza, J. R.; Martin, B. M.; Morrison, J.; Nakos, T.; O'Sullivan, B.; Pindor, B.; Ressler, M.; Shaughnessy, B.; Vandenbussche, B.; Wells, M.; Wright, G.; Zuther, J.
Publisher: SPIE
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Title of Proceedings: Space Telescopes and Instrumentation 2008: Optical, Infrared, and Millimeter
Start Page: 70103A-70103A
End Page: 12
Volume (in Series): 7010
Document Type: Conference-Paper
ID: 421575.0
System engineering and management in a large and diverse multinational consortium
Authors: Wright, David; O'Sullivan, Brian; Thatcher, John; Renouf, Ian; Wright, Gillian; Wells, Martyn; Glasse, Alistair; Grözinger, Ulrich; Sykes, Jon; Smith, Dave; Eccleston, Paul; Shaughnessy, Bryan
Place of Publication: Bellingham, Wash.
Publisher: SPIE
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
Title of Proceedings: Modeling, Systems Engineering, and Project Management for Astronomy III
Start Page: 701708-701708
End Page: 12
Title of Series: SPIE
Volume (in Series): 7017
Document Type: Conference-Paper
ID: 421410.0
Entries: 1-2  
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