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Magnetism-induced symmetry breaking in photoelectron diffraction patterns
Authors: Chass‚é, A.; Kuch, W.; Kotsugi, M.; Gao, X.; Offi, F.; Imada, S.; Suga, S.; Daimon, H.; Kirschner, J.
Date of Publication (YYYY-MM-DD): 2005
Title of Journal: Physical Review B
Volume: 71
Issue / Number: 1
Start Page: 014444/1
End Page: 01444410
Document Type: Article
ID: 275388.0
Micromagnetic properties of the Cu/Ni crossed-wedge film on Cu(001)
Authors: Fukumoto, K.; Daimon, H.; Chelaru, L. I.; Offi, F.; Kuch, W.; Kirschner, J.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Surface Science
Volume: 514
Start Page: 151
End Page: 155
Document Type: Article
ID: 33393.0
Entries: 1-2  
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