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Spontaneous desorption time of flight mass spectrometry for the analysis of chemical reactions in thin solid films of a few monolayers and up to the micrometer regime
Authors: Krämer, S.; Wohlfart, P.; Sterthaus, R.; Einsiedel, H.; Vydra, J.; Mittler, Silvia
Date of Publication (YYYY-MM-DD): 2002-05-31
Title of Journal: Thin Solid Films
Volume: 411
Issue / Number: 2
Start Page: 211
End Page: 218
Document Type: Article
ID: 28657.0
Photothermal Beam Deflection Spectroscopy in the Near IR on Poly[3-alkylthiophene]s
Authors: Einsiedel, H.; Kreiter, Maximilian; Leclerc, M.; Mittler-Neher, Silvia
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Optical Materials
Volume: 10
Start Page: 61
End Page: 68
Document Type: Article
ID: 347080.0
Photothermal beam deflection techniques: Useful tools for integrated optics
Authors: Einsiedel, H.; Mittler-Neher, Silvia
Date of Publication (YYYY-MM-DD): 1996
Title of Journal: Optica Applicata
Volume: 26
Issue / Number: 4
Start Page: 347
End Page: 357
Document Type: Article
ID: 609098.0
Entries: 1-3  
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