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Polarity determination of a GaN thin film on sapphire (0001) with X-ray standing waves.
Authors: Kazimirov, A.; Scherb, G.; Zegenhagen, J.; Lee, T. L.; Bedzyk, M. J.; Kelly, M. K.; Angerer, H.; Ambacher, O.
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Journal of Applied Physics
Volume: 84
Start Page: 1703
End Page: 1705
Document Type: Article
ID: 182216.0
Spectroscopic ellipsometry of AlxGa1-xN in the energy range 3-25 eV.
Authors: Wethkamp, T.; Wilmers, K.; Esser, N.; Richter, W.; Ambacher, O.; Angerer, H.; Jungk, G.; Johnson, R. L.; Cardona, M.
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Thin Solid Films
Volume: 313-314
Start Page: 745
End Page: 750
Document Type: Article
ID: 180490.0
Entries: 1-2  
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