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Titanium–silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
Authors: Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. A.; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 2048
End Page: 2054
Document Type: Article
ID: 397148.0
Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
Authors: Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. .; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 2048
End Page: 2054
Document Type: Article
ID: 398650.0
Titanium-silicon oxide film structures for polarization-modulated infrared reflection absorption spectroscopy
Authors: Dunlop, I. E.; Zorn, S.; Richter, G.; Srot, V.; Kelsch, M.; van Aken, P. .; Skoda, M.; Gerlach, A.; Spatz, J. P.; Schreiber, F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 2048
End Page: 2054
Document Type: Article
ID: 412628.0
Direct measurement of normal and shear forces between surface-grown polyelectrolyte layers
Authors: Dunlop, I. E.; Briscoe, W. H.; Titmuss, S.; Jacobs, R. M. J.; Osborne, V. L.; Edmondson, S.; Huck, W. T. S.; Klein, J.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Journal of Physical Chemistry B
Volume: 113
Issue / Number: 12
Start Page: 3947
End Page: 3956
Document Type: Article
ID: 430614.0
Entries: 1-4  
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