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Entries: 1-4  
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Advantages of the 'optical cavity substrate' for real time infrared spectroscopy of plasma-surface interactions
Authors: von Keudell, A.; Abelson, J. R.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Journal of Applied Physics
Volume: 91
Start Page: 4840
End Page: 4845
Document Type: Article
ID: 20673.0
Thermally induced changes in the hydrogen microstructure of amorphous hydrogenated silicon films, analyzed using in situ real time infrared spectroscopy
Authors: Keudell, A. von; Abelson, J. R.
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Japanese Journal of Applied Physics. Part 1
Volume: 38
Issue / Number: 7A
Start Page: 4002
End Page: 4006
Document Type: Article
ID: 625562.0
Direct insertion of SiH3 radicals into strained Si-Si surface bonds during plasma deposition of hydrogenated amorphous silicon films
Authors: Keudell, A. von; Abelson, J. R.
Date of Publication (YYYY-MM-DD): 1999
Title of Journal: Physical Review B
Volume: 59
Issue / Number: 8
Start Page: 5791
End Page: 5798
Document Type: Article
ID: 626155.0
The interaction of atomic hydrogen with very thin amorphous hydrogenated silicon films analyzed using in situ real time infrared spectroscopy: Reaction rates and the formation of hydrogen platelets
Authors: Keudell, A. von; Abelson, J. R.
Date of Publication (YYYY-MM-DD): 1998
Title of Journal: Journal of Applied Physics
Volume: 84
Issue / Number: 1
Start Page: 489
End Page: 495
Document Type: Article
ID: 627763.0
Entries: 1-4  
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