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Distribution of electronic reconstruction at the n-type LaAlO3/SrTiO3 interface revealed by hard x-ray photoemission spectroscopy
Authors: Chu, Y. Y.; Liao, Y. F.; Tra, V. T.; Yang, J. C.; Liu, W. Z.; Chu, Y. H.; Lin, J. Y.; Huang, J. H.; Weinen, J.; Agrestini, S.; Tsuei, K.-D.; Huang, D. J.
Date of Publication (YYYY-MM-DD): 2011-12-27
Title of Journal: Applied Physics Letters
Volume: 99
Issue / Number: 26
Start Page: 262101-1
End Page: 262101-3
Sequence Number of Article: 262101
Document Type: Article
ID: 582177.0
Recent developments of wide-bandgap semiconductor based UV sensors
Authors: BenMoussa, A.; Soltani, A.; Schühle, U.; Haenen, K.; Chong, Y. M.; Zhang, W. J.; Dahal, R.; Lin, J. Y.; Jiang, H. X.; Barkad, H. A.; BenMoussa, B.; Bolseem, D.; Hermans, C.; Kroth, U.; Laubis, C.; Mortet, V.; Jaeger, J.-C. De; Giordanengo, B.; Richter, M.; Scholze, F.; Hochedez, J.-F.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Diamond & Related Materials
Volume: 18
Start Page: 860
End Page: 864
Document Type: Article
ID: 459553.0
Entries: 1-2  
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