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Influence of nanostationary atomic mixing ondepth resolution in suptter depth profiling
Authors: Wang, J. Y.; Liu, S.; Hofmann, S.
Date of Publication (YYYY-MM-DD): 2012
Title of Journal: Surface and Interface Analytics
Volume: 44
Start Page: 560
End Page: 572
Document Type: Article
ID: 627470.0
Metal-catalyzed growth of semiconductor nanostructures without solubility and diffusivity constraints
Authors: Wang, Z. M.; Gu, L.; Phillipp, F.; Wang, J. Y.; Jeurgens, L. P. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Advanced Materials
Volume: 23
Issue / Number: 7
Start Page: 854
End Page: 859
Document Type: Article
ID: 563006.0
Influence of nonstationary atomic mixing on depth resolution in sputter depth profiling
Authors: Wang, J. Y.; Liu, Y.; Hofmann, S.; Kovac, J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Surface and Interface Analysis
Volume: 44
Start Page: 569
End Page: 572
Document Type: Article
ID: 574220.0
Metal-catalyzed growth of semiconductor nanostructures without solubility and diffusivity constraints
Authors: Wang, Z.; Gu, L.; Phillipp, F.; Wang, J. Y.; Jeurgens, L. P. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Advanced Materials
Volume: 23
Start Page: 854
End Page: 859
Document Type: Article
ID: 579657.0
Phase formation at the Sn/Cu interface during room temperature aging: microstructural evolution, whiskering, and interface thermodynamics
Authors: Sobiech, M.; Krüger, C.; Welzel, U.; Wang, J. Y.; Mittemeijer, E. J.; Hügel, W.
Date of Publication (YYYY-MM-DD): 2011
Title of Journal: Journal of Materials Research
Volume: 26
Start Page: 1482
End Page: 1493
Document Type: Article
ID: 579766.0
Evolution of microstructure and stress of and associated whisker growth on Sn layers sputter-deposited on Cu substrates
Authors: Sobiech, M.; Krüger, C.; Welzel, U.; Wang, J. Y.; Mittemeijer, E. J.; Hügel, W.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Journal of Materials Research
Volume: 25
Start Page: 2166
End Page: 2174
Document Type: Article
ID: 531994.0
High-resolution transmission-electron-microscopy study of ultrathin Al-induced crystallization of amorphous Si
Authors: Wang, Z.; Jeurgens, L. P. H.; Wang, J. Y.; Phillipp, F.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2009-11
Title of Journal: Journal of Materials Research
Volume: 24
Issue / Number: 11
Start Page: 3294
End Page: 3299
Document Type: Article
ID: 438876.0
Evaluation of the depth resolutions of auger electron spectroscopic, X-ray photoelectron spectroscopic and time-of-flight secondary-ion mass spectrometric sputter depth profiling techniques
Authors: Wang, J. Y.; Starke, U.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Thin Solid Films
Volume: 517
Start Page: 3402
End Page: 3407
Document Type: Article
ID: 430725.0
Mechanisms of aluminium-induced crystallization and layer exchange upon low-temperature annealing of amorphous Si/polycrystalline Al bilayers.
Authors: Wang, J. Y.; Wang, Z. M.; Jeurgens, L. P. H.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Journal of Nanoscience and Nanotechnology
Volume: 9
Start Page: 3364
End Page: 3371
Document Type: Article
ID: 430727.0
Fundamentals of metal-induced crystallization of amorphous semiconductors
Authors: Wang, Z.; Jeurgens, L. P. H.; Wang, J. Y.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Advanced Engineering Materials
Volume: 11
Start Page: 131
End Page: 135
Document Type: Article
ID: 430728.0
Entries: 1-10  
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