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Entries: 1-5  
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Effect of molecular weight on the structure and crystallinity of poly(3-hexylthiophene)
Authors: Zen, A.; Saphiannikova, M.; Neher, Dieter; Grenzer, J.; Grigorian, S.; Pietsch, U.; Asawapirom, U.; Janietz, S.; Scherf, Ullrich; Lieberwirth, Ingo; Wegner, Gerhard
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Macromolecules
Volume: 39
Issue / Number: 6
Start Page: 2162
End Page: 2171
Document Type: Article
ID: 262986.0
Structure and temperature behavior of metallo-supramolecular assemblies
Authors: Bodenthin, Y.; Pietsch, U.; Grenzer, J.; Geue, T.; Möhwald, H.; Kurth, D. G.
Date of Publication (YYYY-MM-DD): 2005-07-07
Title of Journal: Journal of Physical Chemistry B
Volume: 109
Issue / Number: 26
Start Page: 12795
End Page: 12799
Document Type: Article
ID: 257364.0
Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II
Authors: Panzner, T.; Leitenberger, W.; Grenzer, J.; Bodenthin, Y.; Geue, T.; Pietsch, U.; Möhwald, H.
Date of Publication (YYYY-MM-DD): 2003-05-21
Title of Journal: Journal of Physics D-Applied Physics
Volume: 36
Issue / Number: 10A
Start Page: A93
End Page: A97
Document Type: Article
ID: 112577.0
Temperature- and time-resolved X-ray scattering at thin organic films
Authors: Bodenthin, Y.; Grenzer, J.; Lauter, R.; Pietsch, U.; Lehmann, P.; Kurth, D. G.; Möhwald, H.
Date of Publication (YYYY-MM-DD): 2002
Title of Journal: Journal of Synchrotron Radiation
Volume: 9
Start Page: 206
End Page: 209
Document Type: Article
ID: 20676.0
 
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The energy-dispersive reflectometer at BESSY II: a challenge for thin film analysis.
Authors: Pietsch, U.; Grenzer, J.; Geue, T.; Neissendorfer, F.; Brezesinski, G.; Symietz, C.; Möhwald, H.; Gudat, W.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Nuclear Instruments and Methods in Physics Research A
Volume: 467
Start Page: 1077
End Page: 1080
Document Type: Article
ID: 288207.0
 
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Entries: 1-5  
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