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Structure determination of thin CoFe films by anomalous x-ray diffraction
Authors: Gloskovskii, A.; Stryganyuk, G.; Ouardi, S.; Fecher, G. H.; Felser, C.; Hamrle, J.; Pištora, J.; Bosu, S.; Saito, K.; Sakuraba, Y.; Takanashi, K.
Date of Publication (YYYY-MM-DD): 2012-10-01
Title of Journal: Journal of Applied Physics
Volume: 112
Issue / Number: 7
Start Page: 074903-1
End Page: 074903-3
Sequence Number of Article: 074903
Document Type: Article
ID: 629475.0
Electronic structure and optical, mechanical, and transport properties of the pure, electron-doped, and hole-doped Heusler compound CoTiSb
Authors: Ouardi, S.; Fecher, G. H.; Felser, C.; Schwall, M.; Naghavi, S. S.; Gloskovskii, A.; Balke, B.; Hamrle, J.; Postava, K.; Pistora, J.; Ueda, S.; Kobayashi, K.
Date of Publication (YYYY-MM-DD): 2012-07-16
Title of Journal: Physical Review B
Volume: 86
Issue / Number: 4
Start Page: 045116-1
End Page: 045116-13
Sequence Number of Article: 045116
Document Type: Article
ID: 611284.0
Entries: 1-2  
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