|
|
|
|
Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications |
Authors: Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E. | Date of Publication (YYYY-MM-DD): 2010 | Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy | Title of Journal: Journal of Microscopy | Volume (in Journal): 237 | Issue / Number: 3 | Start Page: 379 | End Page: 383 | Document Type: Conference-Paper | ID: 458868.0 |
|
|
|
|
|
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers |
Authors: Łaszcz, A.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Phillipp, F.; van Aken, P. A.; Katcki, J. | Date of Publication (YYYY-MM-DD): 2010 | Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy | Title of Journal: Journal of Microscopy | Volume (in Journal): 237 | Issue / Number: 3 | Start Page: 347 | End Page: 351 | Document Type: Conference-Paper | ID: 458891.0 |
|
|
|
|
|
Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO2/Si structure |
Authors: Laszcz, A.; Ratajczak, J.; Czerwinski, A.; Katcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Breil, N.; Larrieu, G.; Dubois, E. | Date of Publication (YYYY-MM-DD): 2008 | Name of Conference/Meeting: E-MRS Spring Meeting 2008 | Title of Journal: Materials Science and Engineering B | Volume (in Journal): 154–155 | Start Page: 175 | End Page: 178 | Document Type: Conference-Paper | ID: 394967.0 |
|
|
|
|
|
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures |
Authors: Katcki, J.; Ratajczak, J.; Laszcz, A.; Phillipp, F.; Dubois, E.; Larrieu, G.; Penaud, J.; Baie, X. | Place of Publication: London | Publisher: Institute of Physics | Date of Publication (YYYY-MM-DD): 2003 | Name of Conference/Meeting: Microscopy of Semiconducting Materials 2003 | Title of Proceedings: Microscopy of Semiconducting Materials 2003 | Start Page: 479 | End Page: 482 | Title of Series: Institute of Physics Conference Series | Volume (in Series): 180 | Document Type: Conference-Paper | ID: 169749.0 |
|
|
|
|
|
Electron microscopy study of vertical cavity surface emitting lasers |
Authors: Katcki, J.; Ratajczak, J.; Phillipp, F.; Bugajski, M.; Muszalski, J. | Place of Publication: Bristol | Publisher: IOP Publishing Ltd. | Date of Publication (YYYY-MM-DD): 2001 | Name of Conference/Meeting: Microscopy of Semiconducting Materials | Title of Proceedings: Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference | Start Page: 493 | End Page: 496 | Title of Series: Institute of Physics Conference Series | Volume (in Series): 169 | Document Type: Conference-Paper | ID: 24326.0 |
|
|
The scope and number of records on eDoc is subject
to the collection policies defined by each institute
- see "info" button in the collection browse view.
|
|