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Entries: 1-10  
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Thickness dependent microstructural changes in La0.5Ca0.5MnO3 thin films deposited on (111) SrTiO3
Authors: Aydogdu, G. H.; Kuru, Y.; Nelayah, J.; van Aken, P. A.; Habermeier, H.-U.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EMRS 2009 Spring Meeting
Title of Journal: Thin Solid Films
Volume (in Journal): 518
Issue / Number: 16
Start Page: 4667
End Page: 4669
Document Type: Conference-Paper
ID: 479800.0
EFTEM study of surface plasmon resonances in silver nanoholes
Authors: Sigle, W.; Nelayah, J.; Koch, C. T.; Ögüt, B.; Gu, L.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2010
Title of Journal: Ultramicroscopy
Volume: 110
Start Page: 1094
End Page: 1100
Document Type: Article
ID: 493456.0
Low-loss EFTEM imaging of surface plasmon resonances in Ag nanostructures
Authors: van Aken, P. A.; Sigle, W.; Koch, C. T.; Ögüt, B.; Nelayah, J.; Gu, L.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: Microscopy and Microanalysis 2010
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 16
Issue / Number: Suppl. 2
Start Page: 1438
End Page: 1439
Document Type: Conference-Paper
ID: 493462.0
Direct imaging of surface plasmon resonances on single triangular silver nanoprisms at optical wavelength using low-loss EFTEM imaging
Authors: Nelayah, J.; Gu, L.; Sigle, W.; Koch, C. T.; Pastoriza-Santos, I.; Liz-Marzán, L. M.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Optics Letters
Volume: 34
Start Page: 1003
End Page: 1005
Document Type: Article
ID: 429105.0
Electron energy losses in Ag nanoholes — from localized surface plasmon resonances to rings of fire
Authors: Sigle, W.; Nelayah, J.; Koch, C. T.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Optics Letters
Volume: Vol. 34
Issue / Number: 14
Start Page: 2150
End Page: 2152
Document Type: Article
ID: 432965.0
Surface plasmon resonance effects in a perforated Ag film studied by energy-filtering TEM
Authors: Sigle, W.; Nelayah, J.; Koch, C. T.; Ögüt, B.; van Aken, P. A.
Place of Publication: Graz
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 1: Instrumentation and Methodology
Start Page: 111
End Page: 112
Document Type: Conference-Paper
ID: 435824.0
Study of surface plasmon resonances on assemblies of slits in thin Ag films by low-loss EFTEM imaging
Authors: Ögüt, B.; Sigle, W.; Nelayah, J.; Koch, C. T.; van Aken, P. A.
Place of Publication: Graz, Austria
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 1: Instrumentation and Methodology
Start Page: 131
End Page: 132
Document Type: Conference-Paper
ID: 435825.0
Mapping of valence energy losses via energy-filtered annular dark-field scanning transmission electron microscopy
Authors: Gu, L.; Sigle, W.; Koch, C. T.; Nelayah, J.; Srot, V.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2009
Title of Journal: Ultramicroscopy
Volume: 109
Start Page: 1164
End Page: 1170
Document Type: Article
ID: 437025.0
Application of monochromated electrons in EELS
Authors: Sigle, W.; Gu, L.; Koch, C.; Srot, V.; Nelayah, J.; van Aken, P. A.
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: Microscopy and Microanalysis 2008. Microscopy Society of America, 66th Annual Meeting. Microbeam Analysis Society, 42nd Annual Meeting. International Metallographic Society, 41st Annual Meeting
Title of Journal: Microscopy and Microanalysis
Volume (in Journal): 14
Issue / Number: Supplement S2
Start Page: 134
End Page: 135
Document Type: Conference-Paper
ID: 372672.0
Band gap mapping using monochromated electrons
Authors: Gu, L.; Sigle, W.; Koch, C. T.; Srot, V.; Nelayah, J.; van Aken, P. A.
Place of Publication: Berlin [et al.]
Publisher: Springer
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: 14th European Microscopy Congress
Title of Proceedings: EMC2008, 14th European Microscopy Congress, Vol. 1: Instrumentation and Methods
Start Page: 381
End Page: 382
Document Type: Conference-Paper
ID: 376640.0
Entries: 1-10  
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