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Transmission electron microscopy study of erbium silicide formation from Ti/Er stack for Schottky contact applications
Authors: Ratajczak, J.; Łaszcz, A.; Czerwinski, A.; Katcki, J.; Phillipp, F.; van Aken, P. A.; Reckinger, N.; Dupois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 379
End Page: 383
Document Type: Conference-Paper
ID: 458868.0
Transmission electron microscopy characterization of Au/Pt/Ti/Pt/GaAs ohmic contacts for high power GaAs/InGaAs semiconductor lasers
Authors: Łaszcz, A.; Czerwinski, A.; Ratajczak, J.; Szerling, A.; Phillipp, F.; van Aken, P. A.; Katcki, J.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: EM 2008 - XIII International Conference on Electron Microscopy
Title of Journal: Journal of Microscopy
Volume (in Journal): 237
Issue / Number: 3
Start Page: 347
End Page: 351
Document Type: Conference-Paper
ID: 458891.0
Characterization of ytterbium silicide formed in ultra high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Date of Publication (YYYY-MM-DD): 2010
Name of Conference/Meeting: 16th International Conference on Microscopy of Semiconducting Materials
Title of Journal: Journal of Physics: Conference Series
Volume (in Journal): 209
Sequence Number: 012056
Document Type: Conference-Paper
ID: 466661.0
HRTEM characterization of erbium silicide formed in ultra-high vacuum
Authors: Łaszcz, A.; Ratajczak, J.; Czerwinski, A.; Kątcki, J.; Phillipp, F.; van Aken, P. A.; Yarekha, D.; Reckinger, N.; Larrieu, G.; Dubois, E.
Place of Publication: Graz
Publisher: Verlag der Technischen Universität Graz, Austria
Date of Publication (YYYY-MM-DD): 2009
Name of Conference/Meeting: MC2009, Microscopy Conference
Title of Proceedings: MC2009. Vol. 3: Materials Science
Start Page: 31
End Page: 32
Document Type: Conference-Paper
ID: 435835.0
Transmission electron microscopy study of the platinum germanide formation process in the Ge/Pt/Ge/SiO2/Si structure
Authors: Laszcz, A.; Ratajczak, J.; Czerwinski, A.; Katcki, J.; Srot, V.; Phillipp, F.; van Aken, P. A.; Breil, N.; Larrieu, G.; Dubois, E.
Date of Publication (YYYY-MM-DD): 2008
Name of Conference/Meeting: E-MRS Spring Meeting 2008
Title of Journal: Materials Science and Engineering B
Volume (in Journal): 154–155
Start Page: 175
End Page: 178
Document Type: Conference-Paper
ID: 394967.0
Electron microscopy study of advanced heterostructures for optoelectronics
Authors: Katcki, J.; Ratajczak, J.; Phillipp, F.; Muszalski, J.; Bugajski, M.; Chen, J. X.; Fiore, A.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Materials Chemistry and Physics
Volume: 81
Issue / Number: 2-3
Start Page: 244
End Page: 248
Document Type: Article
ID: 48890.0
Transmission electron microscopy study of Au/ZrB2Ag(Te) contacts to GaSb
Authors: Katcki, J.; Laszcz, A.; Ratajczak, J.; Phillipp, F.; Guziewicz, M.; Piotrowska, A.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Materials Chemistry and Physics
Volume: 81
Issue / Number: 2-3
Start Page: 260
End Page: 264
Document Type: Article
ID: 48893.0
Transmission electron microscopy of In(Ga)As quantum dot structures
Authors: Katcki, J.; Ratajczak, J.; Laszcz, A.; Phillipp, F.; Paranthoen, C.; Cheng, X. L.; Fiore, A.; Passaseo, A.; Cingolani, R.
Date of Publication (YYYY-MM-DD): 2003
Title of Journal: Electron Technology Internet Journal
Volume: 35
Start Page: 1
End Page: 6
Document Type: Article
ID: 49870.0
Transmission electron microscopy analysis of silicides used in ALSB-SOI MOSFET structures
Authors: Katcki, J.; Ratajczak, J.; Laszcz, A.; Phillipp, F.; Dubois, E.; Larrieu, G.; Penaud, J.; Baie, X.
Place of Publication: London
Publisher: Institute of Physics
Date of Publication (YYYY-MM-DD): 2003
Name of Conference/Meeting: Microscopy of Semiconducting Materials 2003
Title of Proceedings: Microscopy of Semiconducting Materials 2003
Start Page: 479
End Page: 482
Title of Series: Institute of Physics Conference Series
Volume (in Series): 180
Document Type: Conference-Paper
ID: 169749.0
Electron microscopy study of vertical cavity surface emitting lasers
Authors: Katcki, J.; Ratajczak, J.; Phillipp, F.; Bugajski, M.; Muszalski, J.
Place of Publication: Bristol
Publisher: IOP Publishing Ltd.
Date of Publication (YYYY-MM-DD): 2001
Name of Conference/Meeting: Microscopy of Semiconducting Materials
Title of Proceedings: Microscopy of Semiconducting Materials 2001. Proceedings of the Royal Microscopical Society Conference
Start Page: 493
End Page: 496
Title of Series: Institute of Physics Conference Series
Volume (in Series): 169
Document Type: Conference-Paper
ID: 24326.0
Entries: 1-10  
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