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Scanning probe studies of the electrical activity at interfaces formed by silicon wafer direct bonding
Authors: Ratzke, M.; Vyvenko, O. F.; Yu, X.; Reif, J.; Kittler, M.; Reiche, M.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Physica Status Solidi C
Volume: 4
Issue / Number: 8
Start Page: 2893
End Page: 2897
Document Type: Article
ID: 352207.0
Magnetic and collective rotation in Br-79
Authors: Schwengner, R.; Donau, F.; Servene, T.; Schnare, H.; Reif, J.; Winter, G.; Kaubler, L.; Prade, H.; Skoda, S.; Eberth, J.; Thomas, H. G.; Becker, F.; Fiedler, B.; Freund, S.; Kasemann, S.; Steinhardt, T.; Thelen, O.; Härtlein, T.; Ender, C.; Köck, F.; Reiter, P.; Schwalm, D.
Date of Publication (YYYY-MM-DD): 2002-04
Title of Journal: Physical Review C
Volume: 65
Issue / Number: 4
Start Page: 044326
End Page: 044326
Sequence Number of Article: 044326
Document Type: Article
ID: 31845.0
Entries: 1-2  
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