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Entries: 1-4  
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DEPFET, a monolithic active pixel sensor for the ILC
Authors: Velthuis, J.; Kohrs, R.; Mathes, M.; Raspereza, A.; Reuen, L.; Andriecek, L.; Koch, M.; Dolezal, Z.; Fischer, P.; Frey, A.; Giesen, F.; Kodys, P.; Kreidl, C.; Krüger, H.; Lodomez, P.; Lutz, G.; Moser, H. - G.; Richter, R. - H.; Sandow, C.; Scheirich, D.; Torne, E.; Trimpl, M.; Wei, Q.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A
Issue / Number: 2
Start Page: 685
End Page: 689
Document Type: Article
ID: 543939.0
Progress towards a large area, thin DEPFET detector module
Authors: Fischer, P.; Andricek, L.; Herrmann, S.; Karagounis, M.; Kohrs, R.; Kreidl, C.; Krüger, H.; Lutz, G.; Moser, G. -G.; Peric, I.; Porro, M.; Reuen, L.; Richter, R. H.; Rummel, S.; Sandow, C.; Strüder, L.; Torne, E.; Treis, J.; Trimpl, M.; Velthuis, J.; Wermes, N.
Date of Publication (YYYY-MM-DD): 2007
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A
Issue / Number: 3
Start Page: 843
End Page: 848
Document Type: Article
ID: 543951.0
The MOS-type DEPFET pixel sensor for the ILC environment
Authors: Andricek, L.; Fischer, P.; Heinzinger, K.; Herrmann, S.; Herz, D.; Karagounis, M.; Kohrs, R.; Krüger, H.; Lechner, P.; Lutz, G.; Moser, H. G.; Peric, I.; Reuen, L.; Richter, R. H.; Sandow, C.; Schnecke, M.; Schopper, F.; Strüder, L.; Törne, E. V.; Treis, J.; Trimpl, M.; Velthuis, J.; Wermes, N.; Wölfel, S.
Date of Publication (YYYY-MM-DD): 2006-09-01
Name of Conference/Meeting: International Workshop on Semiconductor Pixel Detectors for Particles and Imaging
Title of Journal: Nuclear Instruments and Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment
Volume (in Journal): 565
Issue / Number: 1
Start Page: 165
End Page: 171
Document Type: Conference-Paper
ID: 288742.0
 
Full text / Content available
DEPFET Active Pixel Detectors
Authors: Moser, H. -G.; Andricek, L.; Chen, X.; Frey, A.; Lutz, G.; Richter, R. H.; Schnecke, M.; Raspereza, A.; Rummel, S.; Feld, L.; Jussen, R.; Karpinski, W.; Hettkamp, P.; Kohrs, R.; Karagounis, M.; Koch, M.; Krueger, H.; Lodomez, P.; Mathes, M.; Reuen, L.; Sandow, C.; Schneider, J.; von Toerne, E.; Trimpl, M.; Velthuis, J.; Wermes, N.; de Boer, W.; Bol, J.; Sabellek, A.; Fischer, P.; Giesen, G.; Kreidel, C.; Peric, I.; Treis, J.; Schopper, F.; Strueder, L.; Dolezal, Z.; Drasal, Z.; Kodys, P.; Kvasnicka, P.; Scheirich, D.; Carbonell, I.; Fuster, J.; Lacasta, C.; Marinas, C.; Vos, M.
Document Type: Conference-Paper
ID: 544442.0
Entries: 1-4  
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