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Entries: 1-3  
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X-ray diffraction analysis of the anisotropic nature of the structural imperfections in a sputter-deposited TiO2/Ti3Al bilayer.
Authors: Zhao, Y. H.; Welzel, U.; van Lier, J.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2006
Title of Journal: Thin Solid Films
Volume: 514
Start Page: 110
End Page: 119
Document Type: Article
ID: 285120.0
 
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Interdiffusion at TiO2/Ti, TiO2/Ti3Al and TiO2/TiAl interfaces studied in bilayer structures
Authors: Zalar, A.; van Lier, J.; Mittemeijer, E. J.; Kovac, J.
Date of Publication (YYYY-MM-DD): 2002-08
Title of Journal: Surface and Interface Analysis
Volume: 34
Issue / Number: 1
Start Page: 514
End Page: 518
Document Type: Article
ID: 6710.0
Reactions in TiO2/Ti3Al and TiO2/TiAl bilayers: Application of target-factor analysis in auger electron spectroscopy
Authors: van Lier, J.; Baretzky, B.; Zalar, A.; Mittemeijer, E. J.
Date of Publication (YYYY-MM-DD): 2000
Title of Journal: Surface and Interface Analysis
Volume: 30
Start Page: 124
End Page: 129
Document Type: Article
ID: 200640.0
Entries: 1-3  
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