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Entries: 1-6  
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Photoelectron spectroscopy as a non-invasive method to monitor SASE-FEL spectra
Authors: Wellhöfer, M.; Hoeft, Jon Tobias; Martins, M.; Wurth, W.; Braune, Markus; Viefhaus, Jens; Tiedtke, K.; Richter, M.
Date of Publication (YYYY-MM-DD): 2008-02-08
Title of Journal: Journal of Instrumentation
Volume: 3
Start Page: 02003-1
End Page: 02003-13
Document Type: Article
ID: 401014.0
Adsorption geometry of CN on Cu(1 1 1) and Cu(1 1 1)/O
Authors: Polcik, Martin; Kittel, Martin; Hoeft, Jon Tobias; Terborg, Ralf; Toomes, Rachel Louise; Woodruff, David Phillip
Date of Publication (YYYY-MM-DD): 2004-08-10
Title of Journal: Surface Science
Volume: 563
Issue / Number: 1-3
Start Page: 159
End Page: 168
Document Type: Article
ID: 195003.0
Methyl on Cu(111) - structural determination including influence of co-adsorbed iodine
Authors: Pascal, Mathieu; Lamont, Christine L.A.; Kittel, Martin; Hoeft, Jon Tobias; Constant, Laurent; Polcik, Martin; Bradshaw, Alexander M.; Toomes, Rachel; Woodruff, David Phillip
Date of Publication (YYYY-MM-DD): 2002-07-01
Title of Journal: Surface Science
Volume: 512
Issue / Number: 3
Start Page: 173
End Page: 184
Document Type: Article
ID: 8369.0
Cu(100)c(2 x 2)-N: a new type of adsorbate-induced surface reconstruction
Authors: Driver, S. M.; Hoeft, Jon Tobias; Polcik, Martin; Kittel, Martin; Terborg, Ralf; Toomes, Rachel L.; Kang, J.-H.; Woodruff, David Phillip
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Journal of Physics: Condensed Matter
Volume: 13
Issue / Number: 26
Start Page: L 601
End Page: L 606
Document Type: Article
ID: 401198.0
Molecular adsorption bond lengths at metal oxide surfaces: Failure of current theoretical methods.
Authors: Hoeft, Jon Tobias; Kittel, Martin; Polcik, Martin; Bao, Shining; Toomes, Rachel L.; Kang, J.-H.; Woodruff, David Phillip; Pascal, Mathieu; Lamont, Christine L. A.
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Physical Review Letters
Volume: 87
Issue / Number: 8
Start Page: 086101-1
End Page: 086101-4
Document Type: Article
ID: 411736.0
 
Full text / Content available
Photoelectron diffraction structure determination of Cu(100)c(2x2)-N.
Authors: Hoeft, Jon Tobias; Polcik, Martin; Kittel, Martin; Terborg, Ralf; Toomes, Rachel L.; Kang, J.-H.; Woodruff, David Phillip
Date of Publication (YYYY-MM-DD): 2001
Title of Journal: Surface Science
Volume: 492
Issue / Number: 1-2
Start Page: 1
End Page: 10
Document Type: Article
ID: 411740.0
Entries: 1-6  
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